Introduction and Interaction with Radiation-Matter
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Explores sample preparation techniques for TEM, such as cleaved wedge method and ultramicrotomy, highlighting their importance in obtaining high-quality samples.
Covers fundamental characterization approaches for solid materials, focusing on elemental analysis, thermal analysis, microscopy, and neutron-based spectroscopies.
Explores HRTEM image formation through interference of transmitted and diffracted beams, covering contrast transfer function, aberration correction, and phase retrieval techniques.
Covers the principles of Scanning Electron Microscopy, including SEM signals, detectors, and energy spectrum of electrons, as well as the efficiency of X-ray generation.
Covers electron microscopy techniques, components, and applications, including historical development, lens aberrations correction, and electron interaction with matter.
Explores in-situ and ultrafast Lorentz Transmission Electron Microscopy, covering dynamic imaging, observing atoms, charges, spins, lattice dynamics, magnetic skyrmions, and coherent control using laser pulses.
Explores electron microscopy techniques for polymer morphological characterization, covering contrast sources, beam damage, and strategies to avoid damage.
Covers the basics of Scanning Electron Microscopy, including electron-sample interactions, detectors, sample preparation, image formation, resolution, and contrasts in SEM images.
Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
