Lecture

Electron Microscopy of Polymers

Graph Chat

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

In course

MSE-451: Polymer morphological characterization techniques

Sample preparation and direct observation techniques (optical microscopy, AFM, electron microscopy) and their practical application to the study of morphology and microdeformation in polymers. ...

Description

This lecture covers the techniques of scanning electron microscopy and transmission electron microscopy for morphological characterization of polymers, including electron processing assembly, sources of contrast, mass thickness contrast, quantitative analysis, defocus effects, beam damage, charging, contamination, loss of crystallinity, and avoiding beam damage through temperature control, voltage adjustment, carbon film protection, and specimen preparation.

Instructor

John Christopher Plummer

ÉCOLE POLYTECHNIQUE FÉDÉRALE DE LAUSANNE (EPFL), Lausanne, Switzerland 1989- Collaborateur Scientifique/Chargé de Cours (Lecturer) (1998-) Privat Docent (1998) Laboratoire de Technologie des Composites et Polymères (LTC) (2000-) Laboratoire de Polymères (LP) (1998-2000) UNIVERSITY OF MICHIGAN (UMICH), Ann Arbor, MI, USA 1995-1996 Visiting Scientist, Department of Materials Science and Engineering (DMSE) UNIVERSITY OF CAMBRIDGE, Cambridge, UK 1986-1989 Research Assistant, Physics and Chemistry of Solids Group (PCS), Department of Physics UNIVERSITY OF CAMBRIDGE, Cambridge, UK, Department of Materials 1986 PhD, "Flux Pinning in Type-II Superconductors" UNIVERSITY OF CAMBRIDGE, Cambridge, UK, 1982 BA/MA Honours Degree in Natural Sciences Awards Prix R&R Haenny, 2007, DuPont Research Award, 2003, Commendation, British Polymer Group, Reading 1989 RECENT PUBLICATIONS Ramier J, Da Costa N, Plummer CJG, Leterrier Y, Manson JAE, Eckert R, Gaudiana R, Cohesion and adhesion of nanoporous TiO2 coatings on titanium wires for photovoltaic applications, Thin solid films, 516, 1913 (2008). Ramier J, Plummer CJG, Leterrier Y, Manson JAE, Eckert B, Gaudiana R, Mechanical integrity of dye-sensitized photovoltaic fibers, Renewable energy, 33, 314 (2008).

Houphouet-Boigny C, Plummer CJG, Wakeman MD, Manson JAE, Hybrid glass fiber-reinforced thermoplastic nanocomposites, J. Thermoplast. Comp. Mater., 21, 103 (2008).

Ternat C, Ouali L, Sommer H, Fieber W, Velazco MI, Plummer CJG, Kreutzer G, Klok HA, Manson JAE, Herrmann, Investigation of the Release of Bioactive Volatiles from Amphiphilic Multiarm Star-Block Copolymers by Thermogravimetry and Dynamic Headspace Analysis, Macromolecules 41(19), 7079 (2008). Ruggerone, R., Plummer, C.J.G., Negrete Herrera, N., Bourgeat-Lami, E., Månson, J-EA, Mechanical properties of highly filled latex-based polystyrene/laponite nanocomposites, Solid State Phenomena Vol. 151, 30 (2009). Plummer, CJG, Dalle Vacche, S, Houphouët-Boigny, C, Michaud, V, Månson, JAE, Hybrid Glass Mat Reinforced Polypropylene-Montmorillonite Nanocomposites, Solid State Phenomena Vol. 151, 60 (2009). Ruggerone, R., Plummer, C.J.G., Negrete Herrera, N., Bourgeat-Lami, E., Månson, J-EA, Highly filled polystyrenelaponite nanocomposites prepared by emulsion polymerization, European Polm. J. 45, 621 (2009). Ruggerone, R., Plummer, C.J.G., Negrete Herrera, N., Bourgeat-Lami, E., Månson, J-EA, Fracture mechanisms in polystyrene/laponite nanocomposites prepared by emulsion polymerization, Engineering Fracture Mechanics 76, 2846 (2009) Clausen P., Andreoni W., Curioni A., Hughs E., Plummer C.J.G. Adsorption of low-molecular-weight molecules on the surface of a sodium smectite clay: an ab initio study, Journal of Physical Chemistry C 113, 12293 (2009). Clausen P., Andreoni W., Curioni A., Hughs E., Plummer C.J.G., Water adsorption on a sodium smectite clay surface: an ab initio study, Journal of Physical Chemistry C 113, 15218 (2009). Molberg, M, Leterrier, Y., Plummer, C.J.G., Walder, C., Löwe, C., Opris, D.M., Nüesch, F.A., Bauer, S., Månson, J.-A.E., Frequency dependent dielectric and mechanical behaviour of elastomers for actuator applications, J. Appl. Phys. 106, 054112 (2009) Clausen P., Signorelli M., Schreiber A., Hughes E., Plummer CJG, Fessas D., Schiraldi A., Månson E. J.-A., Equilibrium desorption isotherms of water, ethanol, ethyl acetate and toluene on a sodium smectite clay, Journal of Thermal Analysis and Calorimetry 98, 833 (2009) Micusik, M., Bonnefond, A., Reyes, Y., Bogner, A., Chazeau, L., Plummer, C.J.G., Paulis, M., Leiza, J.R., Morphology of Polymer/Clay Latex Particles Synthesized by Miniemulsion Polymerization: Modeling and Experimental Results Macromol. React. Eng. 2010, 4, 432 (2010). Houphouet-Boigny C., Plummer CJG, Vacche SD, Michaud V, Wakeman MD, Månson E. J.-A., Hybrid Glass Mat-reinforced Polypropylene-Montmorillonite Nanocomposites, J. Comp. Mater. 44, 1975 (2010). Delabarde, C., Plummer C.J.G., Bourban, P.-E., Månson E. J.-A., Solidification behavior of PLLA/nHA nanocomposites, Comp. Sci. & Tech. 70, 1813 (2010). Plummer C.J.G., Ruggerone R., Negrete-Herrera N., Bourgeat-Lami E., Månson J.-A.E., Small Strain Mechanical Properties of Latex-Based Nanocomposite Films, Macromol. Symp. 294, 1 (2010). Dalle Vacche, S., Plummer C.J.G., Houphouet-Boigny C., Månson E. J.-A., Morphology and mechanical properties of isotactic polypropylene glass mat thermoplastic composites modified with organophilic montmorillonite, J Mater Sci 46, 2112 (2011).

Official source

Related concepts (17)

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.

Cryogenic electron microscopy

Cryogenic electron microscopy (cryo-EM) is a cryomicroscopy technique applied on samples cooled to cryogenic temperatures. For biological specimens, the structure is preserved by embedding in an environment of vitreous ice. An aqueous sample solution is applied to a grid-mesh and plunge-frozen in liquid ethane or a mixture of liquid ethane and propane. While development of the technique began in the 1970s, recent advances in detector technology and software algorithms have allowed for the determination of biomolecular structures at near-atomic resolution.

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Related lectures (64)

Scanning Electron Microscopy

Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.

Electron Microscopy: Components and Operation

Explores the history and operation of electron microscopes, focusing on components and resolving power.

Electron Microscopy: TEM

Explores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.

Microscopy: General Aspects and Techniques

Covers general aspects and techniques of microscopy, emphasizing resolution importance and exploring scanning tunneling and atomic force microscopy.

SEM Basics: Introduction to Electron Microscopy