Lecture

Transmission Electron Microscopy: Phase Contrast

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In course

MSE-450: Electron microscopy: advanced methods

With this course, the student will learn about advanced methods in transmission electron microscopy, especially what is the electron optical setup involved in the acquisition, and how to interpret the data. After the course, students will be able to unders ...

Description

This lecture introduces the world of phase contrast in transmission electron microscopy, emphasizing the importance of electrons as waves. The instructor explains the interaction between the electron wave and the specimen, the objective lens, and the recording device, highlighting the complexities of phase contrast imaging.

In MOOC

Transmission Electron Microscopy for Materials Sciences

This course provides a comprehensive introduction to transmission electron microscopy (TEM) in the field of materials science. For an instrument operated by a single user, modern TEM provides an analytical platform with unsurpassed versatility, giving access to structural and chemical information from the micrometer to the sub-angstrom scale. In a thin, electron-transparent sample one can measure the crystallinity, grain structure, size, and defects, and the chemical composition. The crystal lattice can be

Instructors (2)

Cécile Hébert

Cécile Hébert was born in France in 1970. She obtained her Ingeneer degree (physics) and her PhD degree (design of a new energy filter for transmission electron microscopy, under the direction of Prof. B. Jouffrey) at the Ecole Centrale in Paris. As a post doc with Prof. P. Schattschneider, she was working on the calculation of the fine structure of ionisation edges in EELS. As a research assistant at the Vienna University of Technology, she was one of the main participant to the CHIRALTEM project dealing with the measurement of magnetic circular dichroism in the electron microscope.

Duncan Thomas Lindsay Alexander

Duncan Alexander graduated with a PhD in Materials Science and Metallurgy at the University of Cambridge in 2003 for a thesis on the kinetics of metallurgical phase transformations under the direction of Lindsay Greer. From 2003 to 2007 he held a Royal Society Overseas Research Fellowship at the University of Sydney, and then post-doctoral positions at the University of Cambridge and Arizona State University, working first on materials electrochemistry with Carsten Schwandt and Derek Fray, and then the characterization of atmospheric aerosol particles with Peter Crozier and Jim Anderson. In 2007 he came to EPFL as a scientific collaborator in the group of László Forró, and from 2008 to 2017 he was a staff scientist at EPFL’s Interdisciplinary Centre for Electron Microscopy (CIME), specializing in the application of advanced transmission electron microscopy techniques and enabling electron microscopy research activities for groups across EPFL through teaching, training and support. In 2018 he joined the Electron Spectrometry and Microscopy Laboratory (LSME) as a full-time research scientist dedicated to advancing transmission electron microscopy techniques, and was promoted to the status of Research and Teaching Associate. In 2019, together with LSME director Cécile Hébert, he launched the first MOOC on transmission electron microscopy for materials science: https://www.coursera.org/learn/microscopy/For a complete list of peer-reviewed publications, see:https://orcid.org/0000-0003-4350-8587

Official source

Related concepts (32)

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Phase-contrast imaging

Phase-contrast imaging is a method of that has a range of different applications. It measures differences in the refractive index of different materials to differentiate between structures under analysis. In conventional light microscopy, phase contrast can be employed to distinguish between structures of similar transparency, and to examine crystals on the basis of their double refraction. This has uses in biological, medical and geological science.

Phase-contrast microscopy

NOTOC Phase-contrast microscopy (PCM) is an optical microscopy technique that converts phase shifts in light passing through a transparent specimen to brightness changes in the image. Phase shifts themselves are invisible, but become visible when shown as brightness variations. When light waves travel through a medium other than a vacuum, interaction with the medium causes the wave amplitude and phase to change in a manner dependent on properties of the medium.

Phase-contrast X-ray imaging

Phase-contrast X-ray imaging or phase-sensitive X-ray imaging is a general term for different technical methods that use information concerning changes in the phase of an X-ray beam that passes through an object in order to create its images. Standard X-ray imaging techniques like radiography or computed tomography (CT) rely on a decrease of the X-ray beam's intensity (attenuation) when traversing the sample, which can be measured directly with the assistance of an X-ray detector.

Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.

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