Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.
DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.
This lecture covers the fundamental components of electron microscopes, including electron sources, lenses, and detectors. It explains the interactions of electrons with samples, the working principles of SEM, TEM, and FIB, and the factors influencing resolution. The advantages of each technique, sample requirements, and preparation methods are discussed. Imaging modes such as SE, BS, and EDX in SEM are explained, along with nanofabrication methods using SEM/FIB. The session also delves into the correlation of AFM with SEM and showcases applications like stiffness tomography and 3D imaging.