Lecture

Ultrafast Lorentz Transmission Electron Microscopy

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In course

MSE-670: Advanced Microscopy for Magnetic Materials

Theoretical and practical expertise is gained about the microscopy of spin structures and magnetic configuiations down to the sub-nm length and sub-ns time scales such as transmission electron microscopy, x-ray and light scattering, magnetic dichroism, and ...

Description

This lecture covers the principles and applications of in-situ and ultrafast Lorentz Transmission Electron Microscopy (LTEM). Topics include dynamic imaging of magnetization, observing atoms, charges, and spins, lattice dynamics, magnetic skyrmions, stroboscopic methods, topological protection, and coherent control of skyrmions using laser pulses. The lecture also discusses the inverse Faraday effect, induced coherent magnons, and the light-control of magnetic bubbles in metallic films.

Instructors (4)

Thomas La Grange

Expertise Electron Microscopy, Aberration Correct Scanning Transmission Electron Microscopy, Electron Diffraction, Ultrafast Transmission Electron Microscopy, Electron Energy Loss Spectroscopy, Energy Dispersive Spectroscopy, Materials Science, High-speed deformation, Dislocation Dynamics, Skyrmionics, Martensitic Phase Transformation Theory, Solidification Expertise Electron Microscopy, Aberration Correct Scanning Transmission Electron Microscopy, Electron Diffraction, Ultrafast Transmission Electron Micro

Fabrizio Carbone

Birth 20/04/1976 Master degree: University of Pavia "optoelectronic engineering". September 2001. Reasearch scientist at Pirelli Labs, Milan Italy between September 2000 and August 2002. PhD in condensed matter physics from the University of Geneva, prof. van der Marel gorup. January 2007 Post doc in physical chemistry at Caltech in prof. Zewail`s group. March 2007-April 2009

Dirk Grundler

Phoebe Marie Tengdin

Official source

Related concepts (32)

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.

Cryogenic electron microscopy

Cryogenic electron microscopy (cryo-EM) is a cryomicroscopy technique applied on samples cooled to cryogenic temperatures. For biological specimens, the structure is preserved by embedding in an environment of vitreous ice. An aqueous sample solution is applied to a grid-mesh and plunge-frozen in liquid ethane or a mixture of liquid ethane and propane. While development of the technique began in the 1970s, recent advances in detector technology and software algorithms have allowed for the determination of biomolecular structures at near-atomic resolution.

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

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Electron Microscopy: TEM

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STEM: Scanning Transmission Electron Microscopy