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Lecture

Transmission Electron Microscopy

In course

MSE-450: Electron microscopy: advanced methods

With this course, the student will learn about advanced methods in transmission electron microscopy, especially what is the electron optical setup involved in the acquisition, and how to interpret the data. After the course, students will be able to unders ...

Description

This lecture series provides an overview of the principles and theory behind transmission electron microscopy for materials science, preparing students for practical training and advanced analytical techniques. Congratulations on completing the course!

In MOOC

Transmission Electron Microscopy for Materials Sciences

Instructors (2)

Cécile Hébert

Cécile Hébert was born in France in 1970. She obtained her Ingeneer degree (physics) and her PhD degree (design of a new energy filter for transmission electron microscopy, under the direction of Prof. B. Jouffrey) at the Ecole Centrale in Paris. As a post doc with Prof. P. Schattschneider, she was working on the calculation of the fine structure of ionisation edges in EELS. As a research assistant at the Vienna University of Technology, she was one of the main participant to the CHIRALTEM project dealing with the measurement of magnetic circular dichroism in the electron microscope.

Duncan Thomas Lindsay Alexander

Duncan Alexander graduated with a PhD in Materials Science and Metallurgy at the University of Cambridge in 2003 for a thesis on the kinetics of metallurgical phase transformations under the direction of Lindsay Greer. From 2003 to 2007 he held a Royal Society Overseas Research Fellowship at the University of Sydney, and then post-doctoral positions at the University of Cambridge and Arizona State University, working first on materials electrochemistry with Carsten Schwandt and Derek Fray, and then the characterization of atmospheric aerosol particles with Peter Crozier and Jim Anderson. In 2007 he came to EPFL as a scientific collaborator in the group of László Forró, and from 2008 to 2017 he was a staff scientist at EPFL’s Interdisciplinary Centre for Electron Microscopy (CIME), specializing in the application of advanced transmission electron microscopy techniques and enabling electron microscopy research activities for groups across EPFL through teaching, training and support. In 2018 he joined the Electron Spectrometry and Microscopy Laboratory (LSME) as a full-time research scientist dedicated to advancing transmission electron microscopy techniques, and was promoted to the status of Research and Teaching Associate. In 2019, together with LSME director Cécile Hébert, he launched the first MOOC on transmission electron microscopy for materials science: https://www.coursera.org/learn/microscopy/For a complete list of peer-reviewed publications, see:https://orcid.org/0000-0003-4350-8587

Official source

Related concepts (15)

Microscopy

Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye (objects that are not within the resolution range of the normal eye). There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy. Optical microscopy and electron microscopy involve the diffraction, reflection, or refraction of electromagnetic radiation/electron beams interacting with the specimen, and the collection of the scattered radiation or another signal in order to create an image.

Cryogenic electron microscopy

Cryogenic electron microscopy (cryo-EM) is a cryomicroscopy technique applied on samples cooled to cryogenic temperatures. For biological specimens, the structure is preserved by embedding in an environment of vitreous ice. An aqueous sample solution is applied to a grid-mesh and plunge-frozen in liquid ethane or a mixture of liquid ethane and propane. While development of the technique began in the 1970s, recent advances in detector technology and software algorithms have allowed for the determination of biomolecular structures at near-atomic resolution.

Phase-contrast microscopy

NOTOC Phase-contrast microscopy (PCM) is an optical microscopy technique that converts phase shifts in light passing through a transparent specimen to brightness changes in the image. Phase shifts themselves are invisible, but become visible when shown as brightness variations. When light waves travel through a medium other than a vacuum, interaction with the medium causes the wave amplitude and phase to change in a manner dependent on properties of the medium.

Phase-contrast imaging

Phase-contrast imaging is a method of that has a range of different applications. It measures differences in the refractive index of different materials to differentiate between structures under analysis. In conventional light microscopy, phase contrast can be employed to distinguish between structures of similar transparency, and to examine crystals on the basis of their double refraction. This has uses in biological, medical and geological science.

Super-resolution microscopy

Super-resolution microscopy is a series of techniques in optical microscopy that allow such images to have resolutions higher than those imposed by the diffraction limit, which is due to the diffraction of light. Super-resolution imaging techniques rely on the near-field (photon-tunneling microscopy as well as those that use the Pendry Superlens and near field scanning optical microscopy) or on the far-field.

Related lectures (32)

Transmission Electron Microscopy: Advanced Techniques MOOC: Transmission Electron Microscopy for Materials Sciences

Explores advanced techniques in transmission electron microscopy, focusing on phase contrast imaging and camera settings.

Microscopic Analyses & Electron Sources

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

High Resolution He Ion Microscopy

Covers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.

Dynamical Effects: Thickness Fringes MOOC: Transmission Electron Microscopy for Materials Sciences

Delves into the dynamical scattering effect of thickness fringes in TEM images, covering equations, intensity plots, and weak beam imaging.

Electron Microscopy: Instrumentation in Life Sciences