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Explores electron microscopy techniques for polymer morphological characterization, covering contrast sources, beam damage, and strategies to avoid damage.
Covers electron microscopy techniques, components, and applications, including historical development, lens aberrations correction, and electron interaction with matter.
Introduces dynamical scattering in TEM, covering single and multiple elastic scattering, 2-beam diffraction, Bloch wave theory, and scattering intensity.
Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
Explores the historical perspective, properties, and applications of X-rays, including diffraction, atomic resolution, and spectral colors of elements.
Explores in-situ and ultrafast Lorentz Transmission Electron Microscopy, covering dynamic imaging, observing atoms, charges, spins, lattice dynamics, magnetic skyrmions, and coherent control using laser pulses.
