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Lecture

Crystal Structure: Diffraction and Bragg's Law

In course

MSE-101(a): Materials:from chemistry to properties

Ce cours permet l'acquisition des notions essentielles relatives à la structure de la matière, aux équilibres et à la réactivité chimique en liaison avec les propriétés mécaniques, thermiques, électriques et magnétiques des matériaux. ...

Description

This lecture covers the principles of diffraction, focusing on the observation of atomic arrangements using transmission electron microscopy and x-ray diffraction. It explains how to determine crystal structures by analyzing diffraction patterns and Miller indices. The lecture also discusses the organization of atoms in solids, including microstructures and composite materials.

Instructor

Véronique Michaud

Background: 1994 Habilitation à diriger des recherches ( INPG, France) 1991 PhD in Materials Engineering ( MIT, USA) 1987 Ingénieur Civil des Mines ( Ecole des Mines de Paris, France) Activities: Since January 2018: Associate Dean of Engineering, in charge of Education June 2012-Dec.2017: Head of the Materials Science and Engineering Section Since April 2017: Associate Professor at EPFL 2009-2017 : Professeur Titulaire at EPFL 1997-2009: Researcher at EPFL 1994-1997 : Chef de Travaux au laboratoire MSS-MAT, Ecole Centrale Paris (France) 1991-1994 : Post-doctoral research associate, MIT (USA) Author of about 300 publications of which 140 in peer-reviewed journals

Official source

Ontological neighbourhood

Earth science

Geology: Mineralogy

Related concepts (32)

Powder diffraction

Powder diffraction is a scientific technique using X-ray, neutron, or electron diffraction on powder or microcrystalline samples for structural characterization of materials. An instrument dedicated to performing such powder measurements is called a powder diffractometer. Powder diffraction stands in contrast to single crystal diffraction techniques, which work best with a single, well-ordered crystal. Diffraction grating The most common type of powder diffraction is with x-rays, the focus of this article although some aspects of neutron powder diffraction are mentioned.

Diffraction

Diffraction is the interference or bending of waves around the corners of an obstacle or through an aperture into the region of geometrical shadow of the obstacle/aperture. The diffracting object or aperture effectively becomes a secondary source of the propagating wave. Italian scientist Francesco Maria Grimaldi coined the word diffraction and was the first to record accurate observations of the phenomenon in 1660.

Crystal structure

In crystallography, crystal structure is a description of the ordered arrangement of atoms, ions, or molecules in a crystalline material. Ordered structures occur from the intrinsic nature of the constituent particles to form symmetric patterns that repeat along the principal directions of three-dimensional space in matter. The smallest group of particles in the material that constitutes this repeating pattern is the unit cell of the structure.

Fraunhofer diffraction

In optics, the Fraunhofer diffraction equation is used to model the diffraction of waves when plane waves are incident on a diffracting object, and the diffraction pattern is viewed at a sufficiently long distance (a distance satisfying Fraunhofer condition) from the object (in the far-field region), and also when it is viewed at the focal plane of an imaging lens. In contrast, the diffraction pattern created near the diffracting object and (in the near field region) is given by the Fresnel diffraction equation.

Fresnel diffraction

In optics, the Fresnel diffraction equation for near-field diffraction is an approximation of the Kirchhoff–Fresnel diffraction that can be applied to the propagation of waves in the near field. It is used to calculate the diffraction pattern created by waves passing through an aperture or around an object, when viewed from relatively close to the object. In contrast the diffraction pattern in the far field region is given by the Fraunhofer diffraction equation. The near field can be specified by the Fresnel number, F, of the optical arrangement.

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