Lecture

Transmission Electron Microscopy: Weak Phase Object Approximation

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In course

MSE-450: Electron microscopy: advanced methods

With this course, the student will learn about advanced methods in transmission electron microscopy, especially what is the electron optical setup involved in the acquisition, and how to interpret the data. After the course, students will be able to unders ...

Description

This lecture covers the principles of Transmission Electron Microscopy, focusing on the Weak Phase Object Approximation. It explains how a thin specimen affects the phase, the concept of the Weak Phase Object Approximation, and the Phase Contrast Transfer Function. The instructor concludes by summarizing the key points.

In MOOC

Transmission Electron Microscopy for Materials Sciences

This course provides a comprehensive introduction to transmission electron microscopy (TEM) in the field of materials science. For an instrument operated by a single user, modern TEM provides an analytical platform with unsurpassed versatility, giving access to structural and chemical information from the micrometer to the sub-angstrom scale. In a thin, electron-transparent sample one can measure the crystallinity, grain structure, size, and defects, and the chemical composition. The crystal lattice can be

Instructors (2)

Cécile Hébert

Cécile Hébert was born in France in 1970. She obtained her Ingeneer degree (physics) and her PhD degree (design of a new energy filter for transmission electron microscopy, under the direction of Prof. B. Jouffrey) at the Ecole Centrale in Paris. As a post doc with Prof. P. Schattschneider, she was working on the calculation of the fine structure of ionisation edges in EELS. As a research assistant at the Vienna University of Technology, she was one of the main participant to the CHIRALTEM project dealing with the measurement of magnetic circular dichroism in the electron microscope.

Duncan Thomas Lindsay Alexander

Duncan Alexander graduated with a PhD in Materials Science and Metallurgy at the University of Cambridge in 2003 for a thesis on the kinetics of metallurgical phase transformations under the direction of Lindsay Greer. From 2003 to 2007 he held a Royal Society Overseas Research Fellowship at the University of Sydney, and then post-doctoral positions at the University of Cambridge and Arizona State University, working first on materials electrochemistry with Carsten Schwandt and Derek Fray, and then the characterization of atmospheric aerosol particles with Peter Crozier and Jim Anderson. In 2007 he came to EPFL as a scientific collaborator in the group of László Forró, and from 2008 to 2017 he was a staff scientist at EPFL’s Interdisciplinary Centre for Electron Microscopy (CIME), specializing in the application of advanced transmission electron microscopy techniques and enabling electron microscopy research activities for groups across EPFL through teaching, training and support. In 2018 he joined the Electron Spectrometry and Microscopy Laboratory (LSME) as a full-time research scientist dedicated to advancing transmission electron microscopy techniques, and was promoted to the status of Research and Teaching Associate. In 2019, together with LSME director Cécile Hébert, he launched the first MOOC on transmission electron microscopy for materials science: https://www.coursera.org/learn/microscopy/For a complete list of peer-reviewed publications, see:https://orcid.org/0000-0003-4350-8587

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Related concepts (17)

Defocus aberration

In optics, defocus is the aberration in which an image is simply out of focus. This aberration is familiar to anyone who has used a camera, videocamera, microscope, telescope, or binoculars. Optically, defocus refers to a translation of the focus along the optical axis away from the detection surface. In general, defocus reduces the sharpness and contrast of the . What should be sharp, high-contrast edges in a scene become gradual transitions. Fine detail in the scene is blurred or even becomes invisible.

Spherical aberration

In optics, spherical aberration (SA) is a type of aberration found in optical systems that have elements with spherical surfaces. Lenses and curved mirrors are prime examples, because this shape is easier to manufacture. Light rays that strike a spherical surface off-centre are refracted or reflected more or less than those that strike close to the centre. This deviation reduces the quality of images produced by optical systems. The effect of spherical aberration was first identified by Ibn al-Haytham who discussed it in his work Kitāb al-Manāẓir.

Optical aberration

In optics, aberration is a property of optical systems, such as lenses, that causes light to be spread out over some region of space rather than focused to a point. Aberrations cause the image formed by a lens to be blurred or distorted, with the nature of the distortion depending on the type of aberration. Aberration can be defined as a departure of the performance of an optical system from the predictions of paraxial optics.

Transmission electron cryomicroscopy

Transmission electron cryomicroscopy (CryoTEM), commonly known as cryo-EM, is a form of cryogenic electron microscopy, more specifically a type of transmission electron microscopy (TEM) where the sample is studied at cryogenic temperatures (generally liquid-nitrogen temperatures). Cryo-EM is gaining popularity in structural biology. The utility of transmission electron cryomicroscopy stems from the fact that it allows the observation of specimens that have not been stained or fixed in any way, showing them in their native environment.

Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.

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