Explores Environmental Scanning Electron Microscopy (ESEM) for imaging diverse samples without preparation, covering electron beam scanning, pressure manipulation, electron scattering, X-ray analysis, and phase transitions.
Explores the principles and applications of Focused Ion Beam technology, covering imaging, milling, TEM sample preparation, nanofabricated structures, and 3D microscopy.
Covers Energy Dispersive X-ray Microanalysis, explaining how X-rays reveal elemental composition and discussing X-ray generation, detection, efficiency, and quantification.
Introduces EBSD and ESEM, covering acquisition, sample preparation, indexing, applications, and data analysis, along with the operation and benefits of ESEM.