Lecture

Energy Dispersive X-ray Microanalysis

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In course

MSE-636: Organic semiconductors

Description

This lecture introduces Energy Dispersive X-ray Microanalysis (EDX), a technique for elemental analysis based on X-ray spectroscopy. It explains how X-rays are emitted from a specimen when hit by charged particles, and how the energy and number of emitted X-rays reveal the elemental composition. The lecture covers X-ray generation, core shell ionization, forbidden transitions, X-ray efficiency, and X-ray production yield. It also discusses the detection of X-rays using detectors like Si(Li) and SDD, as well as the quantification and mapping of elements using EDX. The lecture concludes with details on EDX systems, processing methods, and Monte-Carlo simulations.

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Instructor

Frank Nüesch

Teaching & PhD PhD Students Elodie Didier, Ceren Mitmit, João Pedro Ferreira Assunção, Vahid Charkhesht Past EPFL PhD Students Hui Zhang, Simon Johannes Dünki, Yee Song Ko, Lei Wang, Sandra Christina Jenatsch, Nicolas Alexandre Serge Leclaire, Donatas Gesevicius, Surendra Babu Anantharaman, Markus Regnat, Philip Horst Caspari, Patrik Schürch, David Reber, Karen Verena Strassel, Sina Abdolhosseinzadeh, Matthias Diethelm, Francis Owusu, Camilla Arietta Vael-Garn, Yeerlan Adeli, Wei-Hsu Hu, Cansu Zeytun Kara

Official source

Related concepts (32)

X-ray spectroscopy

X-ray spectroscopy is a general term for several spectroscopic techniques for characterization of materials by using x-ray radiation. When an electron from the inner shell of an atom is excited by the energy of a photon, it moves to a higher energy level. When it returns to the low energy level, the energy which it previously gained by the excitation is emitted as a photon which has a wavelength that is characteristic for the element (there could be several characteristic wavelengths per element).

X-ray detector

X-ray detectors are devices used to measure the flux, spatial distribution, spectrum, and/or other properties of X-rays. Detectors can be divided into two major categories: imaging detectors (such as photographic plates and X-ray film (photographic film), now mostly replaced by various digitizing devices like s or flat panel detectors) and dose measurement devices (such as ionization chambers, Geiger counters, and dosimeters used to measure the local radiation exposure, dose, and/or dose rate, for example, for verifying that radiation protection equipment and procedures are effective on an ongoing basis).

X-ray fluorescence

X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science, archaeology and art objects such as paintings.

X-ray

X-ray radiation, or, much less commonly, X-radiation, is a penetrating form of high-energy electromagnetic radiation. Most X-rays have a wavelength ranging from 10 nanometers to 10 picometers, corresponding to frequencies in the range 30 petahertz to 30 exahertz (3e16Hz to 3e19Hz) and energies in the range 124 keV to 145 eV, respectively. X-ray wavelengths are shorter than those of UV rays and typically longer than those of gamma rays.

Game

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