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Lecture

Practical Demo on Merlin

In course

MSE-636: Organic semiconductors

Description

This lecture provides a practical demonstration on using the Merlin SEM, covering topics such as column setup, detectors, scanning controls, and specimen analysis. The instructor showcases various features and functionalities of the Merlin SEM.

Instructor

Frank Nüesch

Official source

Related concepts (31)

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Particle detector

In experimental and applied particle physics, nuclear physics, and nuclear engineering, a particle detector, also known as a radiation detector, is a device used to detect, track, and/or identify ionizing particles, such as those produced by nuclear decay, cosmic radiation, or reactions in a particle accelerator. Detectors can measure the particle energy and other attributes such as momentum, spin, charge, particle type, in addition to merely registering the presence of the particle.

Semiconductor detector

A semiconductor detector in ionizing radiation detection physics is a device that uses a semiconductor (usually silicon or germanium) to measure the effect of incident charged particles or photons. Semiconductor detectors find broad application for radiation protection, gamma and X-ray spectrometry, and as particle detectors. In semiconductor detectors, ionizing radiation is measured by the number of charge carriers set free in the detector material which is arranged between two electrodes, by the radiation.

Gaseous ionization detector

Gaseous ionization detectors are radiation detection instruments used in particle physics to detect the presence of ionizing particles, and in radiation protection applications to measure ionizing radiation. They use the ionising effect of radiation upon a gas-filled sensor. If a particle has enough energy to ionize a gas atom or molecule, the resulting electrons and ions cause a current flow which can be measured. Gaseous ionisation detectors form an important group of instruments used for radiation detection and measurement.

Thermomechanical analysis

Thermomechanical analysis (TMA) is a technique used in thermal analysis, a branch of materials science which studies the properties of materials as they change with temperature. Thermomechanical analysis is a subdiscipline of the thermomechanometry (TM) technique. Thermomechanometry is the measurement of a change of a dimension or a mechanical property of the sample while it is subjected to a temperature regime. An associated thermoanalytical method is thermomechanical analysis.

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