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Ce cours d'introduction à la microscopie a pour but de donner un apperçu des différentes techniques d'analyse de la microstructure et de la composition des matériaux, en particulier celles liées aux microscopies électronique et optique. Le cours comprend d ...
The course relates on the use of electromagnetic (X-Ray) and corpuscular (electrons) radiations for physical and chemical analysis of solid materials. ...
The course presents the detection of ionizing radiation in the keV and MeV energy ranges. Physical processes of radiation/matter interaction are introduced. All steps of detection are covered, as well as detectors, instrumentations and measurements methods ...
State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and ...
Explores Environmental Scanning Electron Microscopy (ESEM) for imaging diverse samples without preparation, covering electron beam scanning, pressure manipulation, electron scattering, X-ray analysis, and phase transitions.