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Course

CH-410: Physical and chemical analyses of materials

Summary

This course will cover the fundamentals and practical aspects of advanced material characterization methods, with a focus on inorganic materials. Students will become familiar with spectroscopy and electron microscopy techniques.

Lectures

Instructors

Official source

https://edu.epfl.ch/coursebook/en/physical-and-chemical-analyses-of-materials-CH-410

Moodle Page

http://go.epfl.ch/CH-410

About this result

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Summary

Lectures

Instructors

Official source

https://edu.epfl.ch/coursebook/en/physical-and-chemical-analyses-of-materials-CH-410

Moodle Page

http://go.epfl.ch/CH-410

About this result

Ontological neighbourhood

Chemistry

Physical chemistry: Spectroscopy

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

Health sciences

Radiology: Topics in radiology

Lectures in this course (14)

Beam-Matter Interactions

Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.

Chemical Analysis: AES and Data Analysis

Explores Auger Electron Spectroscopy (AES) as a tool for chemical analysis.

Chemical Analysis: X-Ray Micro-Analysis XRMA

Covers X-Ray Micro-Analysis (XRMA) comparing techniques for analyzing matter with electron beams, discussing interaction volume, emission, fluorescence, and matrix effects.

Scanning probe microscopy: basics

Covers the basics of Scanning Probe Microscopy, focusing on STM and AFM, explaining principles, imaging techniques, and spectroscopy methods.

Surface characterization: physical aspects

Explores surface morphology, topography, and specific surface area using advanced techniques for material characterization.

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