Course

CH-410: Physical and chemical analyses of materials

Summary

This course will cover the fundamentals and practical aspects of advanced material characterization methods, with a focus on inorganic materials. Students will become familiar with spectroscopy and electron microscopy techniques.

Lectures

Instructors

Official source

https://edu.epfl.ch/coursebook/en/physical-and-chemical-analyses-of-materials-CH-410

Moodle Page

http://go.epfl.ch/CH-410

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Summary

Lectures

Instructors

Official source

https://edu.epfl.ch/coursebook/en/physical-and-chemical-analyses-of-materials-CH-410

Moodle Page

http://go.epfl.ch/CH-410

About this result

Lectures in this course (13)

Chemical Analysis: AES and Data Analysis

Explores Auger Electron Spectroscopy (AES) as a tool for chemical analysis.

Chemical Analysis: X-Ray Micro-Analysis XRMA

Covers X-Ray Micro-Analysis (XRMA) comparing techniques for analyzing matter with electron beams, discussing interaction volume, emission, fluorescence, and matrix effects.

X-Ray Fluorescence Spectrometry XRFS

Covers X-Ray Fluorescence Spectrometry (XRFS), a chemical analysis technique using emitted X-rays when excited by an X-ray primary beam.

Chemical analysis: X-Ray photoelectron spectrometry

Covers X-Ray Photoelectron Spectrometry (XPS), a surface analysis technique developed by Kai Siegbahn, explaining its components, mechanism, and analysis methods.

Chemical analysis: spectrometry

Covers chemical analysis using spectrometry, focusing on X-ray and electron spectrometers, monochromators, and calibration methods.

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