Course

CH-633: Advanced Solid State and Surface Characterization

Summary

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from X-ray scattering (SAXS/GISAXS, PDF, GIWAXS, HRXRD), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).

Lectures

Instructors (3)

Emad Oveisi

Dr Emad Oveisi is a senior scientist at the Interdisciplinary Centre for Electron Microscopy (CIME), EPFL. Emad received a BSc in Metallurgy and Materials Engineering (2005) and an MSc in Materials Science (2008) both from the University of Tehran (Iran). He graduated with a PhD in Materials Science and Engineering at EPFL in 2014 for a thesis on the "Three-Dimensional STEM Imaging of Dislocations" under the direction of Prof. Cécile Hébert. The PhD thesis at the Electron Spectrometry and Microscopy Laboratory (LSME), served as an introduction to many of the advanced microscopy techniques that have proven to be a platform for his research career. A post-doctoral research at the centre for electron microscopy gave him the opportunity to peruse a cutting-edge research on one of the most modern aberration-corrected transmission electron microscopes.Since the inauguration of the Energypolis campus of EPFL in Sion, he has been the manager and reference scientist of the electron microscopy platform of EPFL-Valais, working with 9 research groups and more than 200 researchers. In addition to this core responsibility, he provides advanced microscopy consulting and service to EPFL scientists and assist their research to the highest level possible. Emad Oveisi’s research focuses on the application and development of novel electron microscopy techniques, with emphasis on 3D imaging of crystal defects, as well as the precision measurement of materials properties using aberration-corrected S/TEM. In 2018, he received the prestigious Microscopy Innovation Award for inventing “Single-shot three-dimensional electron imaging”, a novel technique that enables 3D imaging of in situ dynamics. In 2016 Emad was elected as an interim representative for the scientific staff ("corps intermédiaire") to the Council of the Institute of Chemistry (ISIC). Since 2019, he is a member of EPFL Teachers’ Council (CCE) and has been elected as one of its four bureau members. This role allows him to be exposed to new ideas and pedagogical challenges, as well being involved in discussions with the Vice Presidency of Education (VPE) and other teaching organisations for defining teaching strategies at the EPFL.

Mounir Driss Mensi

Teaching & PhD Courses Advanced Solid State and Surface Characterization CH-633 State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from X-ray scattering (SAXS/GISAXS, PDF, GIWAXS, HRXRD), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM). Characterization of Materials 2025 MSE-716 This course introduces materials characterization techni

Pascal Alexander Schouwink

Teaching & PhD Courses Advanced Solid State and Surface Characterization CH-633 State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from X-ray scattering (SAXS/GISAXS, PDF, GIWAXS, HRXRD), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM). Principles and Applications of X-ray Diffraction CH-632 Basic theoretical aspects of Crystallograph

Official source

Moodle Page

http://go.epfl.ch/CH-633

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Summary

Lectures

Instructors (3)

Emad Oveisi

Mounir Driss Mensi

Pascal Alexander Schouwink

Teaching & PhD Courses Advanced Solid State and Surface Characterization CH-633 State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from X-ray scattering (SAXS/GISAXS, PDF, GIWAXS, HRXRD), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM). Principles and Applications of X-ray Diffraction CH-632 Basic theoretical aspects of Crystallograph

Official source

Moodle Page

http://go.epfl.ch/CH-633

Lectures in this course (12)

Auger Spectroscopy & Scanning Probe Microscopy

Covers Auger spectroscopy and Scanning Probe Microscopy techniques for chemical analysis and surface imaging.

Surface Characterization: SPM, Raman & IR

Covers surface characterization techniques like SPM, Raman & IR spectroscopy, including AFM modes, artifacts, calibration, molecular vibrations, and IR/Raman spectroscopy principles.

Electron Spectroscopy: XPS/UPS

Explores X-ray and Ultraviolet Photoelectron Spectroscopy principles, applications, and case studies on TiO2 coatings and doped films.

Raman & IR Spectroscopy: Molecular Vibrations & Spatial Resolution

Explores the molecular origin of IR absorption, Raman scattering, and the spatial resolution challenges in spectroscopy.

X-ray Photoelectron Spectroscopy: Fundamentals and Applications

Explores X-ray Photoelectron Spectroscopy fundamentals, applications, challenges, and sputtering techniques for surface analysis.

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