MSE-619: Nanofabrication with focused electron and ion beamsNanofabrication with focused charged particle beams (SEM, FIB) and their applications such as lithography, gas assisted deposition / etching, and milling are discussed and the limitations of these processes are developed based on the acquired understanding ...
MSE-637(b): Transmission electron microscopy and diffraction (b)This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, s ...
MSE-352: Introduction to microscopy + Laboratory workCe cours d'introduction à la microscopie a pour but de donner un apperçu des différentes techniques d'analyse de la microstructure et de la composition des matériaux, en particulier celles liées aux microscopies électronique et optique. Le cours comprend d ...
MSE-627: X-Ray Analysis for thin filmsIntro into the relation between physical and structural properties; introduction into different X-Ray techniques; examples of successful technological transfer using X-Ray techniques;
Structural properties; coherent and non coherent scattering; high resolu ...
MSE-450: Electron microscopy: advanced methodsWith this course, the student will learn about advanced methods in transmission electron microscopy, especially what is the electron optical setup involved in the acquisition, and how to interpret the data. After the course, students will be able to unders ...
MSE-637(a): Transmission electron microscopy and diffraction (a)This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, s ...
MSE-305: Introduction to atomic-scale modelingThis course provides an introduction to the modeling of matter at the atomic scale, using interactive Jupyter notebooks to see several of the core concepts of materials science in action. ...
MSE-675: Introduction to SEM and FIB microanalysisModern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multi-modal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniqu ...
MSE-609: 21Intro Scanning electron microscopy techniquesModern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micron-scales. The aim of the course is to present the extend ...
MSE-651: Crystallography of structural phase transformationsThe microstructure of many alloys and ceramics are constituted of very fine intricate domains (variants) created by diffusive or displacive phase transformations. The course introduces the crystallographic tools required to define, calculate and predict th ...
