Course

MSE-675: Introduction to SEM and FIB microanalysis

Summary

Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multi-modal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniques and practical work.

Lectures

Instructors (2)

Xavier Maeder

Teaching & PhD PhD Students Samuel Felix Bojarski, Kamila Elzbieta Hamulka, Philipp Konrad Clewie Kroeker Past EPFL PhD Students as codirector Nicolò Maria Della Ventura Courses Advanced Microscopy for Materials MSE-677 This course provides an overview of advanced materials characterization techniques, focusing on modern Scanning Electron Microscopy (SEM) combined with Focused Ion Beam (FIB) systems (dual-beam), as well as Transmission Electron Microscopy (TEM) and Atom Probe Tomography (A

Lorenz Herrmann

Teaching & PhD Courses Advanced Microscopy for Materials MSE-677 This course provides an overview of advanced materials characterization techniques, focusing on modern Scanning Electron Microscopy (SEM) combined with Focused Ion Beam (FIB) systems (dual-beam), as well as Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT).

Official source

https://edu.epfl.ch/coursebook/en/introduction-to-sem-and-fib-microanalysis-MSE-675

Moodle Page

http://go.epfl.ch/MSE-675

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Summary

Lectures

Instructors (2)

Xavier Maeder

Lorenz Herrmann

Official source

https://edu.epfl.ch/coursebook/en/introduction-to-sem-and-fib-microanalysis-MSE-675

Moodle Page

http://go.epfl.ch/MSE-675

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