Mediaspace scheduled maintenance: Aug 25, 2026 07:00 - 12:00 AM. During this time, videos will be temporarily unavailable. Check status updates.

Graph
Search

Course

MSE-609: 21Intro Scanning electron microscopy techniques

Summary

Modern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micron-scales. The aim of the course is to present the extended analytical possibilities of such device.

Lectures

Instructor

Xavier Maeder

Official source

https://edu.epfl.ch/coursebook/en/21intro-scanning-electron-microscopy-techniques-MSE-609

Moodle Page

http://go.epfl.ch/MSE-609

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Summary

Lectures

Instructor

Xavier Maeder

Official source

https://edu.epfl.ch/coursebook/en/21intro-scanning-electron-microscopy-techniques-MSE-609

Moodle Page

http://go.epfl.ch/MSE-609

About this result

Related courses (32)

MSE-352: Introduction to microscopy + Laboratory work

Ce cours d'introduction à la microscopie a pour but de donner un apperçu des différentes techniques d'analyse de la microstructure et de la composition des matériaux, en particulier celles liées aux microscopies électronique et optique. Le cours comprend d ...

PHYS-405: Experimental methods in physics

The course's objectivs are: Learning several advenced methods in experimental physics, and critical reading of experimental papers. ...

CH-633: Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and ...

MSE-637(b): Transmission electron microscopy and diffraction (b)

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, s ...

CH-410: Physical and chemical analyses of materials

The course relates on the use of electromagnetic (X-Ray) and corpuscular (electrons) radiations for physical and chemical analysis of solid materials. ...