Course

MSE-609: 21Intro Scanning electron microscopy techniques

Summary

Modern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micron-scales. The aim of the course is to present the extended analytical possibilities of such device.

Lectures

Instructor

Xavier Maeder

Teaching & PhD PhD Students Samuel Felix Bojarski, Kamila Elzbieta Hamulka, Philipp Konrad Clewie Kroeker Past EPFL PhD Students as codirector Nicolò Maria Della Ventura Courses Advanced Microscopy for Materials MSE-677 This course provides an overview of advanced materials characterization techniques, focusing on modern Scanning Electron Microscopy (SEM) combined with Focused Ion Beam (FIB) systems (dual-beam), as well as Transmission Electron Microscopy (TEM) and Atom Probe Tomography (A

Official source

https://edu.epfl.ch/coursebook/en/21intro-scanning-electron-microscopy-techniques-MSE-609

Moodle Page

http://go.epfl.ch/MSE-609

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Summary

Lectures

Instructor

Xavier Maeder

Official source

https://edu.epfl.ch/coursebook/en/21intro-scanning-electron-microscopy-techniques-MSE-609

Moodle Page

http://go.epfl.ch/MSE-609

About this result

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