Course

MSE-627: X-Ray Analysis for thin films

Summary

Intro into the relation between physical and structural properties; introduction into different X-Ray techniques; examples of successful technological transfer using X-Ray techniques; Structural properties; coherent and non coherent scattering; high resolution X-Ray techniques; stress; coatings.

Lectures

Instructors (2)

Alex Dommann

Teaching & PhD Courses CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films MSE-628 After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measurements, and for interpreting their results. X-Ray Analysis for thin films

Xavier Maeder

Teaching & PhD PhD Students Samuel Felix Bojarski, Kamila Elzbieta Hamulka, Philipp Konrad Clewie Kroeker Past EPFL PhD Students as codirector Nicolò Maria Della Ventura Courses Advanced Microscopy for Materials MSE-677 This course provides an overview of advanced materials characterization techniques, focusing on modern Scanning Electron Microscopy (SEM) combined with Focused Ion Beam (FIB) systems (dual-beam), as well as Transmission Electron Microscopy (TEM) and Atom Probe Tomography (A

Official source

https://edu.epfl.ch/coursebook/en/x-ray-analysis-for-thin-films-MSE-627

Moodle Page

http://go.epfl.ch/MSE-627

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Summary

Lectures

Instructors (2)

Alex Dommann

Xavier Maeder

Official source

https://edu.epfl.ch/coursebook/en/x-ray-analysis-for-thin-films-MSE-627

Moodle Page

http://go.epfl.ch/MSE-627

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