Publications by Georg Fantner | EPFL Graph Search

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Modern high-speed atomic force microscopes generate significant quantities of data in a short amount of time. Each image in the sequence has to be processed quickly and accurately in order to obtain a true representation of the sample and its changes over ...

Discovering mechanisms governing organelle assembly is a fundamental pursuit in biology. The centriole is an evolutionarily conserved organelle with a signature 9-fold symmetrical chiral arrangement of microtubules imparted onto the cilium it templates. Th ...

The interaction of organic molecules with the surface of calcite plays a central role in many geochemical, petrochemical and industrial processes and in biomineralization. Adsorbed organics, typically fatty acids, can interfere with the evolution of calcit ...

In this study, we demonstrate the increased performance in speed and sensitivity achieved by the use of small AFM cantilevers on a standard AFM system. For this, small rectangular silicon oxynitride cantilevers were utilized to arrive at faster atomic forc ...

Employing polymer cantilevers has shown to outperform using their silicon or silicon nitride analogues concerning the imaging speed of atomic force microscopy (AFM) in tapping mode (intermittent contact mode with amplitude modulation) by up to one order of ...

High-speed atomic force microscopy has thus far largely been limited to the use of small cantilevers in liquid, but the technique would greatly profit areas of nanotechnology that require the use of larger probes in air. We present polymer-based cantilever ...

NOVELTY - The microscope has a housing (12), and two actuators (14, 16) are arranged in an opposed push-pull configuration that is coupled to the housing. A support (22) is coupled to the housing and to one of the two actuators at a position that is spaced ...

Grayscale structured surfaces with nanometer-scale features are used in a growing number of applications in optics and fluidics. Thermal scanning probe lithography achieves a lateral resolution below 10 nm and a vertical resolution below 1 nm, but its maxi ...

The success of high-speed atomic force microscopy in imaging molecular motors1, enzymes2 and microbes3 in liquid environments suggests that the technique could be of significant value in a variety of areas of nanotechnology. However, the majority of atomic ...

Improving the imaging speed of atomic force microscopy (AFM) requires accurate nanopositioning at high speeds. However, high speed operation excites resonances in the AFM's mechanical scanner that can distort the image, and therefore typical users of comme ...

High-speed atomic force microscopy (HS-AFM) is a technique capable of revealing the dynamics of biomolecules and living organisms at the nanoscale with a remarkable temporal resolution. The phase delay in the feedback loop dictates the achievable speed of ...

One-Dimensional (1D) nanostructures have gained a considerable attention in the field of semiconductor technology for the past several decades. With the help of rapid development in the process technology, it becomes possible to scale these nanostructures ...

a scanning probe microscope for high-speed imaging and/or nanomechanical mapping. The microscope comprises a scanning probe comprising a cantilever with a tip at the distal end; and means for modulating a tip-sample distance separating the tip from an inte ...

Hundreds of thousands die annually from malaria caused by Plasmodium falciparum (Pf), with the emergence of drug-resistant parasites hindering eradication efforts. Antimicrobial peptides (AMPs) are known for their ability to disrupt pathogen membranes with ...

The present invention relates to a cantilever or membrane comprising a body and an elongated beam attached to the body. The elongated beam includes a first layer comprising a first material, a second layer comprising a second material having an elastic mod ...

In this paper, three different pseudo resistor (PR) realizations are compared regarding their noise and linearity performance within the DC feedback loop of an integrator-differentiator transimpedance amplifier (I-D-TIA). Thanks to its intrinsic shot noise ...

Field-effect transistors (FETs) based on two-dimensional materials (2DMs) with atomically thin channels have emerged as a promising platform for beyond-silicon electronics. However, low carrier mobility in 2DM transistors driven by phonon scattering remain ...

We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the opt ...

In this paper, we present an integrator-differentiator transimpedance amplifier (TIA) featuring a multielement pseudo-resistor (MEPR) in the DC feedback path for improved noise performance in the presence of non-zero DC input currents. The presented protot ...

Super-resolution techniques expand the abilities of researchers who have the knowledge and resources to either build or purchase a system. This excludes the part of the research community without these capabilities. Here we introduce the openSIM add-on to ...

Georg Fantner

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Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

Kinetic and structural roles for the surface in guiding SAS-6 self-assembly to direct centriole architecture

Growth and dissolution of calcite in the presence of adsorbed stearic acid

Increased imaging speed and force sensitivity for bio-applications with small cantilevers using a conventional AFM setup

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process

Self-Actuated Polymer-Based Cantilevers With Sharp Silicon Tips For High-Speed Atomic Force Microscopy

Scanning probe microscope e.g. atomic force microscope, has two actuators arranged in opposed push-pull configuration, and support constrains motion of one of two actuators in one axis to permit translation along another axis

Combining thermal scanning probe lithography and dry etching for grayscale nanopattern amplification

Harnessing the damping properties of materials for high-speed atomic force microscopy

Indirect identification and compensation of lateral scanner resonances in atomic force microscopes

A high-bandwidth voltage amplifier for driving piezoelectric actuators in high-speed atomic force microscopy

Top-Down Fabrication of Silicon Nanowires in Ultra-deep Trenches

Method and apparatus of using a scanning probe microscope

Antimicrobial peptides selectively target malaria parasites by a cholesterol-dependent mechanism

Multilayer mems cantilevers

Comparison of Different Precision Pseudo Resistor Realizations in the DC-Feedback of Capacitive Transimpedance Amplifiers

Deterministic grayscale nanotopography to engineer mobilities in strained MoS2 FETs

High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

An integrator-differentiator TIA using a multi-element pseudo-resistor in its DC servo loop for enhanced noise performance

Open-source microscope add-on for structured illumination microscopy