Publication

Method and apparatus of using a scanning probe microscope

Georg Fantner
2016
Patents

Abstract

a scanning probe microscope for high-speed imaging and/or nanomechanical mapping. The microscope comprises a scanning probe comprising a cantilever with a tip at the distal end; and means for modulating a tip-sample distance separating the tip from an intended sample to be viewed with the microscope, the means for modulating being adapted to provide a direct cantilever actuation.

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Method and apparatus of using a scanning probe microscope

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