Explores applications of micron and submicron focusing, crystallography, and tomographic reconstructions in beamlines, as well as the need for secondary optics and different types of lenses.
Discusses X-ray detectors' properties, sensitivity, and signal-to-noise ratio quantification, as well as systematic errors like flat field corrections.
Covers Energy Dispersive X-ray Microanalysis, explaining how X-rays reveal elemental composition and discussing X-ray generation, detection, efficiency, and quantification.
Explores Energy-Dispersive X-ray Spectroscopy (EDS) in electron microscopy, covering x-ray generation, detection, quantification, and mapping of elements in samples.
Explores the historical perspective, properties, and applications of X-rays, including diffraction, atomic resolution, and spectral colors of elements.
