Xavier Maeder

Teaching & PhD PhD Students Samuel Felix Bojarski, Kamila Elzbieta Hamulka, Philipp Konrad Clewie Kroeker Past EPFL PhD Students as codirector Nicolò Maria Della Ventura Courses Advanced Microscopy for Materials MSE-677 This course provides an overview of advanced materials characterization techniques, focusing on modern Scanning Electron Microscopy (SEM) combined with Focused Ion Beam (FIB) systems (dual-beam), as well as Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT). X-Ray Analysis for thin films MSE-627 Intro into the relation between physical and structural properties; introduction into different X-Ray techniques; examples of successful technological transfer using X-Ray techniques;Structural properties; coherent and non coherent scattering; high resolution X-Ray techniques;stress; coatings.