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Person

Lorenz Herrmann

Teaching & PhD Courses Advanced Microscopy for Materials MSE-677 This course provides an overview of advanced materials characterization techniques, focusing on modern Scanning Electron Microscopy (SEM) combined with Focused Ion Beam (FIB) systems (dual-beam), as well as Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT).

Official source

https://people.epfl.ch/418693?lang=en

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