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Enseignement et PhD Cours CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films MSE-628 After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measurements, and for interpreting their results. X-Ray Analysis for thin films MSE-627
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Yusuf Leblebici, Antonia Neels, Alex Dommann, Zuhal Tasdemir
Francesco Stellacci, Antonia Neels, Alex Dommann, Urszula Beata Cendrowska
Roland Logé, Antonia Neels, Alex Dommann