Alex Dommann

Teaching & PhD Courses CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films MSE-628 After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measurements, and for interpreting their results. X-Ray Analysis for thin films MSE-627 Intro into the relation between physical and structural properties; introduction into different X-Ray techniques; examples of successful technological transfer using X-Ray techniques;Structural properties; coherent and non coherent scattering; high resolution X-Ray techniques;stress; coatings.