Cours

MSE-735: Scanning and Analytical Transmission Electron Microscopy

Résumé

This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.

Séances de cours

Enseignant·e·s (3)

Emad Oveisi

Dr Emad Oveisi is a senior scientist at the Interdisciplinary Centre for Electron Microscopy (CIME), EPFL. Emad received a BSc in Metallurgy and Materials Engineering (2005) and an MSc in Materials Science (2008) both from the University of Tehran (Iran). He graduated with a PhD in Materials Science and Engineering at EPFL in 2014 for a thesis on the "Three-Dimensional STEM Imaging of Dislocations" under the direction of Prof. Cécile Hébert. The PhD thesis at the Electron Spectrometry and Microscopy Laboratory (LSME), served as an introduction to many of the advanced microscopy techniques that have proven to be a platform for his research career. A post-doctoral research at the centre for electron microscopy gave him the opportunity to peruse a cutting-edge research on one of the most modern aberration-corrected transmission electron microscopes.Since the inauguration of the Energypolis campus of EPFL in Sion, he has been the manager and reference scientist of the electron microscopy platform of EPFL-Valais, working with 9 research groups and more than 200 researchers. In addition to this core responsibility, he provides advanced microscopy consulting and service to EPFL scientists and assist their research to the highest level possible. Emad Oveisi’s research focuses on the application and development of novel electron microscopy techniques, with emphasis on 3D imaging of crystal defects, as well as the precision measurement of materials properties using aberration-corrected S/TEM. In 2018, he received the prestigious Microscopy Innovation Award for inventing “Single-shot three-dimensional electron imaging”, a novel technique that enables 3D imaging of in situ dynamics. In 2016 Emad was elected as an interim representative for the scientific staff ("corps intermédiaire") to the Council of the Institute of Chemistry (ISIC). Since 2019, he is a member of EPFL Teachers’ Council (CCE) and has been elected as one of its four bureau members. This role allows him to be exposed to new ideas and pedagogical challenges, as well being involved in discussions with the Vice Presidency of Education (VPE) and other teaching organisations for defining teaching strategies at the EPFL.

Victor Carle Adrien Boureau

Expertise Aberration-corrected TEM and STEMQuantative microscopyElectron diffractionStrain mapping (GPA, precession 4D-STEM)Electric and magnetic field mapping (electron holography, DPC, 4D-STEM) Enseignement et PhD A co-dirigé les thèses EPFL de Pierpaolo Ranieri Cours Scanning and Analytical Transmission Electron Microscopy MSE-735 Transmission electron microscopy and diffraction (a) MSE-637(a) This course is for potential new users of transmission electron microscopes for

David Fernando Reyes Vasquez

Expertise Electron energy loss spectroscopy (EELS)Aberration-corrected TEM and STEM Enseignement et PhD Cours Scanning and Analytical Transmission Electron Microscopy MSE-735

Source officielle

Page Moodle

http://go.epfl.ch/MSE-735

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Résumé

Séances de cours

Enseignant·e·s (3)

Emad Oveisi

Victor Carle Adrien Boureau

David Fernando Reyes Vasquez

Expertise Electron energy loss spectroscopy (EELS)Aberration-corrected TEM and STEM Enseignement et PhD Cours Scanning and Analytical Transmission Electron Microscopy MSE-735

Source officielle

Page Moodle

http://go.epfl.ch/MSE-735

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