Victor Carle Adrien Boureau

Expertise Aberration-corrected TEM and STEMQuantative microscopyElectron diffractionStrain mapping (GPA, precession 4D-STEM)Electric and magnetic field mapping  (electron holography, DPC, 4D-STEM) Enseignement et PhD A co-dirigé les thèses EPFL de Pierpaolo Ranieri Cours Scanning and Analytical Transmission Electron Microscopy MSE-735 Transmission electron microscopy and diffraction (a) MSE-637(a) This course is for potential new users of transmission electron microscopes for study of materials samples. It will give them a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and theories of image formation. Transmission electron microscopy and diffraction (b) MSE-637(b) This course is for potential new users of transmission electron microscopes for study of materials samples. It will give them a basic understanding of the instruments, sample requirements, optics of TEM, electron diffraction, the imaging modes, high-resolution TEM, and theories of image formation.