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CH-633: Advanced Solid State and Surface Characterization

Résumé

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from X-ray scattering (SAXS/GISAXS, PDF, GIWAXS, HRXRD), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM).

Séances de cours

Enseignant·e·s (3)

Emad Oveisi

Dr Emad Oveisi is a senior scientist at the Interdisciplinary Centre for Electron Microscopy (CIME), EPFL. Emad received a BSc in Metallurgy and Materials Engineering (2005) and an MSc in Materials Science (2008) both from the University of Tehran (Iran). He graduated with a PhD in Materials Science and Engineering at EPFL in 2014 for a thesis on the "Three-Dimensional STEM Imaging of Dislocations" under the direction of Prof. Cécile Hébert. The PhD thesis at the Electron Spectrometry and Microscopy Laboratory (LSME), served as an introduction to many of the advanced microscopy techniques that have proven to be a platform for his research career. A post-doctoral research at the centre for electron microscopy gave him the opportunity to peruse a cutting-edge research on one of the most modern aberration-corrected transmission electron microscopes.Since the inauguration of the Energypolis campus of EPFL in Sion, he has been the manager and reference scientist of the electron microscopy platform of EPFL-Valais, working with 9 research groups and more than 200 researchers. In addition to this core responsibility, he provides advanced microscopy consulting and service to EPFL scientists and assist their research to the highest level possible. Emad Oveisi’s research focuses on the application and development of novel electron microscopy techniques, with emphasis on 3D imaging of crystal defects, as well as the precision measurement of materials properties using aberration-corrected S/TEM. In 2018, he received the prestigious Microscopy Innovation Award for inventing “Single-shot three-dimensional electron imaging”, a novel technique that enables 3D imaging of in situ dynamics. In 2016 Emad was elected as an interim representative for the scientific staff ("corps intermédiaire") to the Council of the Institute of Chemistry (ISIC). Since 2019, he is a member of EPFL Teachers’ Council (CCE) and has been elected as one of its four bureau members. This role allows him to be exposed to new ideas and pedagogical challenges, as well being involved in discussions with the Vice Presidency of Education (VPE) and other teaching organisations for defining teaching strategies at the EPFL.

Mounir Driss Mensi

Pascal Alexander Schouwink

Source officielle

Page Moodle

http://go.epfl.ch/CH-633

Résumé

Séances de cours

Enseignant·e·s (3)

Emad Oveisi

Mounir Driss Mensi

Pascal Alexander Schouwink

Source officielle

Page Moodle

http://go.epfl.ch/CH-633

Séances de ce cours (12)

Spectroscopie auger et microscopie par sonde à balayage Connectez-vous à Mediaspace pour regarder cette vidéo

Couvre la spectroscopie Auger et les techniques de microscopie par sonde à balayage pour l'analyse chimique et l'imagerie de surface.

Caractérisation de surface: SPM, Raman & IR Connectez-vous à Mediaspace pour regarder cette vidéo

Couvre les techniques de caractérisation de surface telles que la spectroscopie SPM, Raman et IR, y compris les modes AFM, les artefacts, l'étalonnage, les vibrations moléculaires et les principes de spectroscopie IR / Raman.

Microscopie électronique de transmission Connectez-vous à Mediaspace pour regarder cette vidéo

Couvre les principes et les applications de la microscopie électronique de transmission, y compris l'imagerie, la diffraction, les mécanismes de contraste et les techniques in situ.

XRR et SAXS : Caractérisation avancée Connectez-vous à Mediaspace pour regarder cette vidéo

Introduit la réflectivité des rayons X et la diffusion des rayons X à petit angle pour l'analyse des films et des nanostructures.

Spectroscopie électronique : XPS/UPS Connectez-vous à Mediaspace pour regarder cette vidéo

Explore les principes de la spectroscopie à rayons X et à photoélectrons ultraviolets, les applications et les études de cas sur les revêtements de TiO2 et les films dopés.

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