Emad Oveisi

Expertise Aberration-corrected S/TEM    Analytical SEM/TEM techniques    Electron diffraction techniques    Three-dimensional electron imaging Mission Manage the electron microscopy platform at EPFL Valais Wallis, ensuring cutting-edge capabilities for researchers.    Advise and support EPFL scientists with advanced microscopy techniques and services.    Develop and apply novel microscopy methods to support research at EPFL.    Teach and mentor students and researchers in electron microscopy.    Contribute to and engage in EPFL’s academic and governance initiatives. Current Work Micro-ED    Electron imaging of beam-sensitive materials; 2D materials, MOFs, COFs, Zeolite    3D reconstruction from a limited number of EM datasets Dr Emad Oveisi is a senior scientist at the Interdisciplinary Centre for Electron Microscopy (CIME), EPFL. Emad graduated with a PhD in Materials Science and Engineering at EPFL in 2014 for a thesis on the "Three-Dimensional STEM Imaging of Dislocations" under the direction of Prof. Cécile Hébert. Post-doctoral research at the centre for electron microscopy gave him the opportunity to peruse cutting-edge research on one of the most modern aberration-corrected transmission electron microscopes. In 2022, Emad was promoted to the status of Research and Teaching Associate.Since the inauguration of the Energypolis campus of EPFL in Sion, he has been the manager and reference scientist of the electron microscopy platform of EPFL-Valais, working with 12 research groups and more than 250 researchers. In addition to this core responsibility, he provides advanced microscopy consulting and service to EPFL scientists and assists their research to the highest level possible. Emad Oveisi's research focuses on the application and development of novel electron microscopy techniques, with emphasis on 3D imaging of crystal defects, as well as the precision measurement of materials properties using aberration-corrected S/TEM. Emad Oveisi's pioneering work in the field of electron microscopy has earned him two prestigious awards: the Microscopy Innovation Award for his invention of the "Single-shot three-dimensional electron imaging" technique, which allows real-time 3D imaging of in situ dynamics, and the Rodolphe and Renée Haenny Prize for his important contributions to the development of electron microscopy techniques and his dedication to teaching.In addition to the scientific work, Emad is actively involved in the academic and social life of EPFL. He is currently a member of the EPFL School Assembly. Since 2019, he has been an elected member of EPFL Teachers Council (CCE) and has also been elected as one of the four members of its Bureau. This role allows him to be exposed to new ideas and pedagogical challenges, as well as being involved in discussions with the Vice Presidency of Education (VPE) and other teaching organisations for defining teaching strategies at the EPFL. Emad also represents the teaching community in the Campuses Energy Commission (CECOM) and COVID-19 Operating Committee of EPFL. Education PhD | Materials Science and Engineering 2010 – 2014 EPFL Directed by Cécile Hébert MSc | Materials Science and Engineering 2008 – 2008 University of Tehran BSc | Metallurgy and Materials Engineering 2005 – 2005 University of Tehran Teaching & PhD Past EPFL PhD Students as codirector Gulnaz Ganeeva Courses Advanced Solid State and Surface Characterization CH-633 State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from X-ray scattering (SAXS/GISAXS, PDF, GIWAXS, HRXRD), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM). Characterization of Materials 2025 MSE-716 This course introduces materials characterization techniques used by scientists and engineers. Lectures cover basic theory, applications, and limitations, while lab sessions offer hands-on experience, providing a well-rounded understanding of each method. Scanning and Analytical Transmission Electron Microscopy MSE-735 This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM. Scanning electron microscopy techniques (a) MSE-636(a) This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for theirresearch or who want to understand how to interpret SEM images and analytical results presented in scientificpublications. Scanning electron microscopy techniques (b) MSE-636(b) This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for theirresearch or who want to understand how to interpret SEM images and analytical results presented in scientificpublications. Transmission electron microscopy and diffraction (a) MSE-637(a) This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM. Transmission electron microscopy and diffraction (b) MSE-637(b) This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM. Awards Microscopy Innovation Award Cambridge University 2018 R&R Haenny Prize Société Académique Vaudoise 2020 Research and Teaching Associate School of Basic Sciences - EPFL 2022