The course relates on the use of electromagnetic (X-Ray) and corpuscular (electrons) radiations for physical and chemical analysis of solid materials. ...
The first part of the course is devoted to the self-assembly of molecules. In the second part we discuss basic physical chemical principles of polymers in solutions, at interfaces, and in bulk. Finally, we look at colloids and emulsions. ...
This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who h ...
The course starts from general discussion of the microscopy spatial resolution problem and different proposals to beat classical criteria in the field. Afterwards, modern scanning probe microscopy methods are discussed. ...
Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multi-modal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniqu ...
Modern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micron-scales. The aim of the course is to present the extend ...