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Expertise Scanning electron microscopy SEM Dual beam microscope SEM/FIB EDX analysis Teaching & PhD Courses 3D Electron Microscopy and FIB-Nanotomography MSE-704 The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and compared with x-ray tomography. Scanning electron microscopy techniques (a) MSE-636(a) This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for theirresearch or who want to understand how to interpret SEM images and analytical results presented in scientificpublications. Scanning electron microscopy techniques (b) MSE-636(b) This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for theirresearch or who want to understand how to interpret SEM images and analytical results presented in scientificpublications.
Please note that this is not a complete list of this person’s publications. It includes only semantically relevant works. For a full list, please refer to Infoscience.
Aleksandra Radenovic, Victor Carle Adrien Boureau, Andrey Chernev, Mukeshchand Thakur, Tzu-Heng Chen, Yunfei Teng, Vasily Artemov, Lucie Navratilova, Nianduo Cai
Kevin Sivula, Jun Ho Yum, Liang Yao, Nestor Guijarro Carratala, Florian Le Formal, Yongpeng Liu, Rebekah Anne Wells, Han-Hee Cho, Barbara Alexandra Primera Darwich, Lucie Navratilova
Jan Van Herle, Marco Cantoni, Arata Nakajo, Priscilla Caliandro, Guillaume Jeanmonod, Giorgio Rinaldi, Lucie Navratilova