Victor Carle Adrien Boureau

Expertise Aberration-corrected TEM and STEMQuantative microscopyElectron diffractionStrain mapping (GPA, precession 4D-STEM)Electric and magnetic field mapping  (electron holography, DPC, 4D-STEM) Teaching & PhD Past EPFL PhD Students as codirector Pierpaolo Ranieri Courses Scanning and Analytical Transmission Electron Microscopy MSE-735 This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM. Transmission electron microscopy and diffraction (a) MSE-637(a) This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM. Transmission electron microscopy and diffraction (b) MSE-637(b) This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, specimen preparation and high-resolution TEM.