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The Centre interdisciplinaire de microscopie electronique (CIME) at EPFL is a key research center specializing in electron microscopy. CIME conducts cutting-edge research in various fields, including precision measurement of materials properties, holography, 2D materials imaging, 3D imaging with focused ion beam microscopy, and computational electron microscopy. The center is actively involved in research projects focusing on electron tomography, single particle analysis, electron diffraction techniques, and crystal defects imaging. Additionally, CIME offers courses and practical works in electron microscopy for Bachelor, Master, and PhD students, contributing to the advancement of research in the field.