Course

MSE-704: 3D Electron Microscopy and FIB-Nanotomography

Summary

The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and compared with x-ray tomography.

Lectures

Instructor

Lucie Navratilova

Expertise Scanning electron microscopy SEM Dual beam microscope SEM/FIB EDX analysis Teaching & PhD Courses 3D Electron Microscopy and FIB-Nanotomography MSE-704 The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and compared with x-ray tomography. Scanning electron microscopy techniques (a) MSE-636(a) This intensive course is inten

Official source

https://edu.epfl.ch/coursebook/en/3d-electron-microscopy-and-fib-nanotomography-MSE-704

Moodle Page

http://go.epfl.ch/MSE-704

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Summary

Lectures

Instructor

Lucie Navratilova

Official source

https://edu.epfl.ch/coursebook/en/3d-electron-microscopy-and-fib-nanotomography-MSE-704

Moodle Page

http://go.epfl.ch/MSE-704

About this result

Lectures in this course (9)

3D Microscopy and FIB Nanotomography

Covers 3D techniques in electron microscopy, FIB Nanotomography, image processing, and advanced topics.

Tomography: Imaging by Sections

Covers the method of reconstructing 3D structures from 2D projections in various scientific fields.

Focused Ion Beam: Principles and Applications

Explores the principles and applications of Focused Ion Beam (FIB) technology, including imaging, milling, and 3D microscopy.

Image processing: Basics and 3D Reconstruction

Explores image processing in 2D and 3D, covering ideal imaging conditions, histogram analysis, tools, 3D reconstruction steps, and visualization.

Plasma Focused Ion Beam: Applications and Techniques

Explores Plasma Focused Ion Beam technology, covering high-precision imaging, material deposition, and automated system checks.

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