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Course

MSE-677: Advanced Microscopy for Materials

Summary

This course provides an overview of advanced materials characterization techniques, focusing on modern Scanning Electron Microscopy (SEM) combined with Focused Ion Beam (FIB) systems (dual-beam), as well as Transmission Electron Microscopy (TEM) and Atom Probe Tomography (APT).

Lectures

Instructors (2)

Xavier Maeder

Lorenz Herrmann

Official source

https://edu.epfl.ch/coursebook/en/advanced-microscopy-for-materials-MSE-677

Moodle Page

http://go.epfl.ch/MSE-677

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