Course

MSE-628: CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films

Summary

After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measurements, and for interpreting their results.

Lectures

Instructors (3)

Alex Dommann

Teaching & PhD Courses CCMX Advanced Course - Advanced X-ray Diffraction Methods for Coatings: strain, defects and deformation analysis of thin films MSE-628 After introducing thin film and HR-XRD characterisation methods, theory and limitations are discussed, including examples and how the film structure influences its characteristics. Protocols are presented for establishing reproducible and reliable measurements, and for interpreting their results. X-Ray Analysis for thin films

Antonia Neels

Damien Terebenec

Official source

https://edu.epfl.ch/coursebook/en/ccmx-advanced-course-advanced-x-ray-diffraction-methods-for-coatings-strain-defects-and-deformation-analysis-of-thin-films-MSE-628

Moodle Page

http://go.epfl.ch/MSE-628

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