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Explores electron microscopy instrumentation in life sciences, covering techniques, instrument limitations, components, specimen preparation, beam interactions, and contrast functions.
Explores optical aberrations in microscopy, including spherical, chromatic, coma, astigmatism, and more, impacting image quality and correction methods.
Explores surface scattering phenomena, electron wavelength, constructive interference, organo-metallic particles, and synchrotron radiation in nanosciences.
Covers the 2x2 transfer matrix for optical systems and the characterization using height and angle parameters, along with lens systems and entrance pupils.