Imaging Atoms and Fields at Picometer Scale

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.

Explores the history and operation of electron microscopes, focusing on components and resolving power.

Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.

Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.

Explores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.

Introduces the basics of electron microscopy, covering components, interactions, imaging modes, and nanofabrication techniques.

Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.

Explores advanced SEM techniques and FIB technology for imaging and sample preparation.

Explores advanced techniques in transmission electron microscopy, focusing on phase contrast imaging and camera settings.

Introduces the basics of scanning electron microscopy, covering electron sources, lenses, vacuum system, and detectors.

Offers a practical demonstration on using the Merlin SEM for specimen analysis.

Covers the historical development and key components of Transmission Electron Microscopy, including electron gun, lenses, apertures, and specimen holders.

Covers the principles, applications, and components of Transmission Electron Microscopy (TEM), including imaging modes and advanced techniques.

Covers microscopic analyses using optical and electron microscopy, as well as electron sources.

Covers the principles of electron microscopy, STEM, HAADF, EDX microanalysis, and applications in materials science.

Explores electron microscopy techniques for polymer morphological characterization, covering contrast sources, beam damage, and strategies to avoid damage.

Explores EDS and ESEM principles, x-ray detection, ionization efficiency, Moseley's law, and ESEM sample environments.

Discusses the importance of sample preparation in electron microscopy and various techniques involved.

Explores beam-matter interactions, focusing on emission phenomena from core electron ionization by X-Rays and electrons, and the competition between Auger and X-Rays emissions.

Explores the history of Transmission Electron Microscopy and the advancements in aberration correction techniques, discussing various contrasts in TEM imaging.