Lecture

Beam-Matter Interactions: Emission Phenomena

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In course

CH-410: Physical and chemical analyses of materials

The course relates on the use of electromagnetic (X-Ray) and corpuscular (electrons) radiations for physical and chemical analysis of solid materials. ...

Description

This lecture covers the interactions between beams and matter, focusing on the emission phenomena resulting from the ionization of core electrons by X-Rays and electrons. It explains the emission of photo-electrons and secondary electrons, the relaxation processes leading to X-Rays and Auger electrons emission, and the competition between Auger and X-Rays emissions. Additionally, it discusses the analytical techniques based on photon and electron interactions with matter, such as X-Ray fluorescence and Auger electron spectrometry. The lecture also delves into the detectors used for analyzing X-Rays and electrons emissions, including gas detectors, scintillation solid detectors, and semiconductor solid detectors.

Instructor

Christophe Roussel

Habilitation à Diriger les Recherches (HDR) in chemistry at the Ecole Normale Supérieure Paris-Saclay (Cachan, France)PhD Thesis in physical organic chemistry at the University of Bourgogne Franche-Comté (Besançon, France) / Ecole Normale Supérieure Paris-Saclay (Cachan, France)

Official source

Ontological neighbourhood

Chemistry

Physical chemistry: Spectroscopy

Related concepts (32)

Particle detector

In experimental and applied particle physics, nuclear physics, and nuclear engineering, a particle detector, also known as a radiation detector, is a device used to detect, track, and/or identify ionizing particles, such as those produced by nuclear decay, cosmic radiation, or reactions in a particle accelerator. Detectors can measure the particle energy and other attributes such as momentum, spin, charge, particle type, in addition to merely registering the presence of the particle.

Scintillator

A scintillator ('sɪntɪleɪtər ) is a material that exhibits scintillation, the property of luminescence, when excited by ionizing radiation. Luminescent materials, when struck by an incoming particle, absorb its energy and scintillate (i.e. re-emit the absorbed energy in the form of light). Sometimes, the excited state is metastable, so the relaxation back down from the excited state to lower states is delayed (necessitating anywhere from a few nanoseconds to hours depending on the material).

X-ray detector

X-ray detectors are devices used to measure the flux, spatial distribution, spectrum, and/or other properties of X-rays. Detectors can be divided into two major categories: imaging detectors (such as photographic plates and X-ray film (photographic film), now mostly replaced by various digitizing devices like s or flat panel detectors) and dose measurement devices (such as ionization chambers, Geiger counters, and dosimeters used to measure the local radiation exposure, dose, and/or dose rate, for example, for verifying that radiation protection equipment and procedures are effective on an ongoing basis).

Scintillation counter

A scintillation counter is an instrument for detecting and measuring ionizing radiation by using the excitation effect of incident radiation on a scintillating material, and detecting the resultant light pulses. It consists of a scintillator which generates photons in response to incident radiation, a sensitive photodetector (usually a photomultiplier tube (PMT), a charge-coupled device (CCD) camera, or a photodiode), which converts the light to an electrical signal and electronics to process this signal.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

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