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Explores electron microscopy techniques for polymer morphological characterization, covering contrast sources, beam damage, and strategies to avoid damage.
Covers the principles of scanning electron microscopy at high specimen chamber pressures and the microstructures of magnesium hydride catalyzed with Ni nano-particles or Nb2O5.
Focuses on the practical application of Digital Image Correlation for civil engineers, covering measuring displacement fields and computing strain fields.
Covers X-Ray Micro-Analysis (XRMA) comparing techniques for analyzing matter with electron beams, discussing interaction volume, emission, fluorescence, and matrix effects.
Covers the analysis of power and current consumption in a CMOS camera system, including calculations for amplification stages and comparisons with CCD technology.
Explores electron microscopy principles and techniques for imaging biological structures, including fixation, embedding, staining, and aldehyde action.
Explores ptychography for imaging atoms and fields at picometer scale, covering resolution limits, depth sectioning, Lorentz microscopy, and detector advancements.
