Lecture

Microstructure Characterization by SEM

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Description

This lecture covers the principles of Microstructure Characterization by Scanning Electron Microscopy (SEM), explaining how SEM works, the interactions between electrons and matter, and the generation of backscattered electrons, secondary electrons, and characteristic X-rays. It also discusses the morphology study of raw materials, the study of polished cross-section samples, the setting of a good image in the electron microscope, and the microstructure of hydrated samples. Additionally, it delves into EDX analysis, C(-A)-S-H composition, and EDX mapping for phase distribution and damage characterization in cementitious materials.

In MOOC

Cement Chemistry and Sustainable Cementitious Materials

We all know the concrete used to build our houses, offices, schools, or bridges, but do you know why concrete resists? The aim of this course is to offer solid knowledge on cement chemistry to practioners or to new student in the field. It is therefore not necessary to have a cement background, however basic concepts in chemistry, physics and crystallography can help. This course lasts 6 weeks during which you can take theoretical courses and tutorials to test the cement in the laboratory. You will learn h

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Related concepts (32)

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Electron microscope

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light, electron microscopes have a higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes.

École polytechnique

École polytechnique, also known as Polytechnique or l'X liks, is a grande école located in Palaiseau, France. It specializes in science and engineering and is a founding member of the Polytechnic Institute of Paris. The school was founded in 1794 by mathematician Gaspard Monge during the French Revolution and was militarized under Napoleon I in 1804. It is still supervised by the French Ministry of Armed Forces. Originally located in the Latin Quarter in central Paris, the institution moved to Palaiseau in 1976, in the Paris-Saclay technology cluster.

X-ray fluorescence

X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science, archaeology and art objects such as paintings.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

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