Delves into nanoscale properties, emphasizing surface effects and quantum phenomena, exploring electronic, mechanical, magnetic, photonic, and chemical properties unique to the nanoscale.
Reviews ultrafast carrier and spin dynamics in 2D semiconductors and their heterostructures, exploring unique optical responses and novel applications.
Covers the fundamentals of Scanning Probe Microscopy, including its history, principles, instruments, and applications in semiconductor research and industry.
Explores self-sensing cantilevers in Scanning Probe Microscopy and the advantages of integrated sensor-actuator systems for high-speed data collection.
Explores the fundamentals and applications of scanning probe microscopy, including STM setup, surface reconstruction, quantum tunneling, and scanning force microscopy.
Covers the principles and applications of Atomic Force Microscopy (AFM) for nanoscale metrology, including imaging modes, tip-sample interactions, and image processing.
