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Explores the components and operation of a Transmission Electron Microscope (TEM), including vacuum systems, electron sources, lenses, aberrations, and detectors.
Explores 3D Microscopy and Tomography techniques, including Atom Probe Tomography and Field Emission Microscopy, emphasizing electron tomography principles and applications.
Covers the basics of Scanning Electron Microscopy, including electron-sample interactions, detectors, sample preparation, image formation, resolution, and contrasts in SEM images.
Explores the history of Transmission Electron Microscopy and the advancements in aberration correction techniques, discussing various contrasts in TEM imaging.
Explores in-situ and ultrafast Lorentz Transmission Electron Microscopy, covering dynamic imaging, observing atoms, charges, spins, lattice dynamics, magnetic skyrmions, and coherent control using laser pulses.
Covers the principles of Scanning Electron Microscopy, including SEM signals, detectors, and energy spectrum of electrons, as well as the efficiency of X-ray generation.
Explores ptychography for imaging atoms and fields at picometer scale, covering resolution limits, depth sectioning, Lorentz microscopy, and detector advancements.
Covers electron microscopy techniques, components, and applications, including historical development, lens aberrations correction, and electron interaction with matter.
