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Lecture

Design for Testability: Techniques and Hardware

In course

EE-530: Test of VLSI systems

Test of VLSI Systems covers theoretical knowledge related to the major algorithms used in VLSI test, and design for test techniques. Basic knowledge related to computer-aided design for test techniques, and their integration into a design-flow are presente ...

Description

This lecture covers the design for testability (DFT) techniques in VLSI systems, focusing on ensuring fault detection, reducing test development and execution time. It explores ad-hoc and structured DFT methods, scan design, and the operation of scan-path architecture. The presentation delves into the hardware requirements, scan layout procedures, and the evolution from traditional PCB testing to JTAG boundary scan. It also discusses the IEEE 1149.1-1990 JTAG standard, system test logic, and the TAP controller signals. The lecture concludes with an overview of boundary-scan cells, scan chain views, and types of instructions in the JTAG process.

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Instructor

Alexandre Schmid

Alexandre Schmid received the M.Sc. degree in microengineering and the Ph.D. degree in electrical engineering from the Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland, in 1994 and 2000, respectively. Since 1994, he has been with the EPFL, working with the Integrated Systems Laboratory as a Research and Teaching Assistant, and with the Electronics Laboratories as a Postdoctoral Fellow. In 2002, he was a Senior Research Associate with the Microelectronic Systems Laboratory, where he has been conducting research in the fields of bioelectronic interfaces and implantable biomedical electronics, nonconventional signal processing and neuromorphic hardware, and reliability of nanoelectronic devices, and also teaches with the Microengineering and Electrical Engineering Departments of EPFL. Since 2011, he is a Maître d'Enseignement et de Recherche (MER) Faculty Member with EPFL. He is a coauthor of two books, Reliability of Nanoscale Circuits and Systems, Methodologies and Circuit Architectures, Springer, 2011, and Wireless Cortical Implantable Systems, Springer, 2013, and a coeditor of one book, as well as over 100 articles published in journals and conferences. Dr. Schmid has served as the General Chair of the Fourth International Conference on Nano-Networks in 2009 and has been serving as an Associate Editor of the Institute of Electrical, Information, and Communication Engineers Electronics Express since 2009.

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Related concepts (32)

Boundary scan

Boundary scan is a method for testing interconnects (wire lines) on printed circuit boards or sub-blocks inside an integrated circuit. Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit. The Joint Test Action Group (JTAG) developed a specification for boundary scan testing that was standardized in 1990 as the IEEE Std. 1149.1-1990.

JTAG

JTAG (named after the Joint Test Action Group which codified it) is an industry standard for verifying designs and testing printed circuit boards after manufacture. JTAG implements standards for on-chip instrumentation in electronic design automation (EDA) as a complementary tool to digital simulation. It specifies the use of a dedicated debug port implementing a serial communications interface for low-overhead access without requiring direct external access to the system address and data buses.

Test automation

In software testing, test automation is the use of software separate from the software being tested to control the execution of tests and the comparison of actual outcomes with predicted outcomes. Test automation can automate some repetitive but necessary tasks in a formalized testing process already in place, or perform additional testing that would be difficult to do manually. Test automation is critical for continuous delivery and continuous testing.

Test-driven development

Test-driven development (TDD) is a software development process relying on software requirements being converted to test cases before software is fully developed, and tracking all software development by repeatedly testing the software against all test cases. This is as opposed to software being developed first and test cases created later. Software engineer Kent Beck, who is credited with having developed or "rediscovered" the technique, stated in 2003 that TDD encourages simple designs and inspires confidence.

Unit testing

In computer programming, unit testing is a software testing method by which individual units of source code—sets of one or more computer program modules together with associated control data, usage procedures, and operating procedures—are tested to determine whether they are fit for use. It is a standard step in development and implementation approaches such as Agile. Before unit testing, capture and replay testing tools were the norm. In 1997, Kent Beck and Erich Gamma developed and released JUnit, a unit test framework that became popular with Java developers.

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