Course

EE-530: Test of VLSI systems

Summary

Test of VLSI Systems covers theoretical knowledge related to the major algorithms used in VLSI test, and design for test techniques. Basic knowledge related to computer-aided design for test techniques, and their integration into a design-flow are presented.

Lectures

Instructor

Alexandre Schmid

Alexandre Schmid received the M.Sc. degree in microengineering and the Ph.D. degree in electrical engineering from the Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland, in 1994 and 2000, respectively. Since 1994, he has been with the EPFL, working with the Integrated Systems Laboratory as a Research and Teaching Assistant, and with the Electronics Laboratories as a Postdoctoral Fellow. In 2002, he was a Senior Research Associate with the Microelectronic Systems Laboratory, where he has been conducting research in the fields of bioelectronic interfaces and implantable biomedical electronics, nonconventional signal processing and neuromorphic hardware, and reliability of nanoelectronic devices, and also teaches with the Microengineering and Electrical Engineering Departments of EPFL. Since 2011, he is a Maître d'Enseignement et de Recherche (MER) Faculty Member with EPFL. He is a coauthor of two books, Reliability of Nanoscale Circuits and Systems, Methodologies and Circuit Architectures, Springer, 2011, and Wireless Cortical Implantable Systems, Springer, 2013, and a coeditor of one book, as well as over 100 articles published in journals and conferences. Dr. Schmid has served as the General Chair of the Fourth International Conference on Nano-Networks in 2009 and has been serving as an Associate Editor of the Institute of Electrical, Information, and Communication Engineers Electronics Express since 2009.

Official source

Moodle Page

http://go.epfl.ch/EE-530

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Summary

Lectures

Instructor

Alexandre Schmid

Official source

Moodle Page

http://go.epfl.ch/EE-530

Lectures in this course (22)

Memory Evolution: From DRAM to SRAM

Covers the historical increase in memory cells per chip, the importance of memory in modern IC architectures, the dramatic increase in test time, and various memory faults.

Test of VLSI Systems

Covers test techniques for digital VLSI systems, including fault modeling and design for testability.

Testing of VLSI Systems

Explores the roles of testing in VLSI systems, different testing methodologies, cost analysis, factors affecting yield, and the importance of testing in modern technologies.

Testing of VLSI Systems

Explores defects, errors, and faults in VLSI systems, including fault models and testing challenges.

Fault Collapsing in VLSI Systems

Covers fault collapsing in VLSI systems to reduce redundancy and improve fault detection.

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