Covers X-Ray Micro-Analysis (XRMA) comparing techniques for analyzing matter with electron beams, discussing interaction volume, emission, fluorescence, and matrix effects.
Covers X-Ray Photoelectron Spectrometry (XPS), a surface analysis technique developed by Kai Siegbahn, explaining its components, mechanism, and analysis methods.
Explores applications of micron and submicron focusing, crystallography, and tomographic reconstructions in beamlines, as well as the need for secondary optics and different types of lenses.
Explores X-ray detection technologies, including semiconductor diodes and scintillators, for applications in cancer cell imaging and particle detection.
Explores large-area sensors for X-ray detection, covering direct and indirect methods, detector performance metrics, and active matrix flat panel imagers.
