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Lecture

X-ray Detection Technologies

In course

MICRO-566: Large-area electronics: devices and materials

Introduction to the physical concepts involved in the description of optical and electronic transport properties of thin-film semiconductor materials found in many large-area applications (solar cells, displays, imagers, etc) and introduction to the physic ...

Description

This lecture covers the principles and technologies behind X-ray detection, including direct and indirect detection methods using semiconductor diodes and scintillators. It discusses the performance metrics of X-ray detectors, such as conversion efficiency and refractive index, as well as the use of different materials like a-Se and CdTe. The lecture also explores the application of X-ray detection in PET scanners for cancer cell imaging, emphasizing the need for fast detectors. Additionally, it delves into the development of large-area sensors for particle detection, focusing on a-Si:H and TFA technology for high radiation hardness and spatial resolution.

Instructors (2)

Christophe Ballif

Christophe Ballif is director of the Phototovoltaics and Thin Film Electronics Laboratoryb) (PV-Lab at the institute of microengineering (IMT) in Neuchâtel (part of the EPFL since 2009). The lab focus is on the science and technology of high efficiency heterojunction crystalline cells,so-called passivating contacts for solar cells, multi-junction solar cells include novel generation Perovskite on innovative optical high speed detector and on various macroelectronics application. It also deals with energy management with a focus on integration of solar electricity into the energy system. The PV-Lab has strongly contributed to technology transfer and industrialization of novel devices and full technology with numerous companies. Christophe Ballif graduated as a physicist from the EPFL in 1994, where he also obtained in 1998 his Phd degree working on novel PV materials. He accomplished his postdoctoral research at NREL (Golden, US) on compound semiconductor solar cells (CIGS and CdTe). He worked then at the Fraunhofer ISE (Ge) on crystalline silicon photovoltaics (monocrystalline and multi-crystalline) until 2003 and then at the EMPA in Thun (CH) before becoming full professor at the University of Neuchâtel IMT in 2004, taking over the chair of Prof. A. Shah. Since 2013, C.Ballif is also the director of the new CSEM PV-Center, also located in Neuchâtel. The CSEM PV-Center is focussing more on industrialisation and technology transfer in the field of solar energy, including solar electricity management and storage. At the core of the CSEM PV-center activities lies several "pilot lines" for various kinds of solar cells manufacturing, with a focus coating technologies, wet chemistry processes for crystalline silicon, metalisation techniques for solar cells, and a platform for developing "ideal packaging solutions and polymers" for PV modules. In addition, joined facitilites between CSEM and EPFL of over 800 m2 are available for modules manufacturing, measuring and accelerated aging. CSEM PV-center has also full team dedicated to storage and energy systems and operates a joined center with BFH in Biel for research on electrochemical storage. He (co-) authored over 500 journal and technical papers, as well as several patents. He is an elected member of the SATW, member of the scientific council of the Swiss AEE, and member of the board of the EPFL Energy center. In 2016, he recieved the Becquerel prize for his contributions to the field of high efficiency photovoltaics.

Franz-Josef Haug

I studied Physics between 1990 and 1996 at the Universities of Ulm (Germany) and Waikato (New Zealand). While specializing mostly on Theoretical Physics and Quantum Theory during my studies, I turned towards Experimental Physics for a graduate work on gas-phase epitaxy of silicon. After that, I pursued a PhD program at ETH Zürich (Switzerland), studying Cu(In,Ga)Se2 solar cells. As PostDoc, I went to EMPA (Switzerland) to work on plasma processes for hard coatings of TiN and to the Jülich Research Centre in Germany to study light scattering ZnO front contacts for solar cells. In 2005 I joined the Institute of Microengineering (IMT) at the University of Neuchatel to lead a research group on thin film silicon solar cells within the PV-Lab. In 2009 the IMT was integrated into EPFL. My main research interests are optics, charge transport in semiconductors and renewable energy in general. My current work is devoted to passivating contacts for crystalline silicon solar cells, using thin silicon films as contact layers. In 2015 I was appointed Maitre d'Enseignement et Recherche (Senior Lecturer and Scientist) and member of the Faculty of STI. From 2013 to 2015 I was member of the EFPL Teachers Council (CCE) and from 2016 and 2018 I was elected into the Council of the Engineering School (CF-STI). In 2020 I was elected to become a member of CF-STI. My main objective for the legislature is to represent the role of EPFL's intermediate staff and to raise the awareness for concerns of the satellite campuses.

Official source

Related concepts (32)

Scintillator

A scintillator ('sɪntɪleɪtər ) is a material that exhibits scintillation, the property of luminescence, when excited by ionizing radiation. Luminescent materials, when struck by an incoming particle, absorb its energy and scintillate (i.e. re-emit the absorbed energy in the form of light). Sometimes, the excited state is metastable, so the relaxation back down from the excited state to lower states is delayed (necessitating anywhere from a few nanoseconds to hours depending on the material).

Scintillation counter

A scintillation counter is an instrument for detecting and measuring ionizing radiation by using the excitation effect of incident radiation on a scintillating material, and detecting the resultant light pulses. It consists of a scintillator which generates photons in response to incident radiation, a sensitive photodetector (usually a photomultiplier tube (PMT), a charge-coupled device (CCD) camera, or a photodiode), which converts the light to an electrical signal and electronics to process this signal.

X-ray detector

X-ray detectors are devices used to measure the flux, spatial distribution, spectrum, and/or other properties of X-rays. Detectors can be divided into two major categories: imaging detectors (such as photographic plates and X-ray film (photographic film), now mostly replaced by various digitizing devices like s or flat panel detectors) and dose measurement devices (such as ionization chambers, Geiger counters, and dosimeters used to measure the local radiation exposure, dose, and/or dose rate, for example, for verifying that radiation protection equipment and procedures are effective on an ongoing basis).

X-ray

X-ray radiation, or, much less commonly, X-radiation, is a penetrating form of high-energy electromagnetic radiation. Most X-rays have a wavelength ranging from 10 nanometers to 10 picometers, corresponding to frequencies in the range 30 petahertz to 30 exahertz (3e16Hz to 3e19Hz) and energies in the range 124 keV to 145 eV, respectively. X-ray wavelengths are shorter than those of UV rays and typically longer than those of gamma rays.

Liquid scintillation counting

Liquid scintillation counting is the measurement of radioactive activity of a sample material which uses the technique of mixing the active material with a liquid scintillator (e.g. zinc sulfide), and counting the resultant photon emissions. The purpose is to allow more efficient counting due to the intimate contact of the activity with the scintillator. It is generally used for alpha particle or beta particle detection.

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