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Course

MSE-351: Surface analysis

Summary

The course treats the main surface analysis methods for the characterization of surfaces, interfaces and thin films. It discusses how these methods can be applied to gain specific knowledge about structural, chemical and functional properties of surfaces and thin films. Limitation to 18 students!

Lectures

Instructor

Anna Neus Igual Muñoz

Official source

https://edu.epfl.ch/coursebook/en/surface-analysis-MSE-351

Moodle Page

http://go.epfl.ch/MSE-351

About this result

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Summary

Lectures

Instructor

Anna Neus Igual Muñoz

Official source

https://edu.epfl.ch/coursebook/en/surface-analysis-MSE-351

Moodle Page

http://go.epfl.ch/MSE-351

About this result

Ontological neighbourhood

Chemistry

Physical chemistry: Spectroscopy

Analytical chemistry: Mass spectrometry

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

Lectures in this course (3)

XPS: Surface Analysis Techniques Log in to Mediaspace to watch this video

Introduces X-ray Photoelectron Spectroscopy (XPS) for surface analysis, covering principles, applications, analysis process, and depth profiling techniques.

Film Thickness Determination: XPS Analysis Log in to Mediaspace to watch this video

Explains film thickness determination using XPS and AES techniques, covering principles, instrumentation, and analytical comparisons.

Principle of SIMS Log in to Mediaspace to watch this video

Explains the principle of Secondary Ion Mass Spectrometry (SIMS) and its applications.

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