Lecture

Auger Spectroscopy & Scanning Probe Microscopy

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In course

CH-633: Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and ...

Description

This lecture covers Auger spectroscopy, a technique for chemical analysis discovered by Lise Meitner, and Scanning Probe Microscopy, including Atomic Force Microscopy. It explains the principles, instrumental setup, analysis methods, and working principles of these techniques.

Instructors (3)

Mounir Driss Mensi

Teaching & PhD Courses Advanced Solid State and Surface Characterization CH-633 State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from X-ray scattering (SAXS/GISAXS, PDF, GIWAXS, HRXRD), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM). Characterization of Materials 2025 MSE-716 This course introduces materials characterization techni

Emad Oveisi

Dr Emad Oveisi is a senior scientist at the Interdisciplinary Centre for Electron Microscopy (CIME), EPFL. Emad received a BSc in Metallurgy and Materials Engineering (2005) and an MSc in Materials Science (2008) both from the University of Tehran (Iran). He graduated with a PhD in Materials Science and Engineering at EPFL in 2014 for a thesis on the "Three-Dimensional STEM Imaging of Dislocations" under the direction of Prof. Cécile Hébert. The PhD thesis at the Electron Spectrometry and Microscopy Laboratory (LSME), served as an introduction to many of the advanced microscopy techniques that have proven to be a platform for his research career. A post-doctoral research at the centre for electron microscopy gave him the opportunity to peruse a cutting-edge research on one of the most modern aberration-corrected transmission electron microscopes.Since the inauguration of the Energypolis campus of EPFL in Sion, he has been the manager and reference scientist of the electron microscopy platform of EPFL-Valais, working with 9 research groups and more than 200 researchers. In addition to this core responsibility, he provides advanced microscopy consulting and service to EPFL scientists and assist their research to the highest level possible. Emad Oveisi’s research focuses on the application and development of novel electron microscopy techniques, with emphasis on 3D imaging of crystal defects, as well as the precision measurement of materials properties using aberration-corrected S/TEM. In 2018, he received the prestigious Microscopy Innovation Award for inventing “Single-shot three-dimensional electron imaging”, a novel technique that enables 3D imaging of in situ dynamics. In 2016 Emad was elected as an interim representative for the scientific staff ("corps intermédiaire") to the Council of the Institute of Chemistry (ISIC). Since 2019, he is a member of EPFL Teachers’ Council (CCE) and has been elected as one of its four bureau members. This role allows him to be exposed to new ideas and pedagogical challenges, as well being involved in discussions with the Vice Presidency of Education (VPE) and other teaching organisations for defining teaching strategies at the EPFL.

Official source

Ontological neighbourhood

Chemistry

Physical chemistry: Spectroscopy

Related concepts (32)

Atomic force microscopy

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Spectroscopy

Spectroscopy is the field of study that measures and interprets the electromagnetic spectra that result from the interaction between electromagnetic radiation and matter as a function of the wavelength or frequency of the radiation. Matter waves and acoustic waves can also be considered forms of radiative energy, and recently gravitational waves have been associated with a spectral signature in the context of the Laser Interferometer Gravitational-Wave Observatory (LIGO).

Auger electron spectroscopy

Auger electron spectroscopy (AES; pronounced oʒe in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. It is a form of electron spectroscopy that relies on the Auger effect, based on the analysis of energetic electrons emitted from an excited atom after a series of internal relaxation events. The Auger effect was discovered independently by both Lise Meitner and Pierre Auger in the 1920s.

Scanning probe microscopy

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.

Infrared spectroscopy

Infrared spectroscopy (IR spectroscopy or vibrational spectroscopy) is the measurement of the interaction of infrared radiation with matter by absorption, emission, or reflection. It is used to study and identify chemical substances or functional groups in solid, liquid, or gaseous forms. It can be used to characterize new materials or identify and verify known and unknown samples. The method or technique of infrared spectroscopy is conducted with an instrument called an infrared spectrometer (or spectrophotometer) which produces an infrared spectrum.

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